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Characterization of the electro-optical behavior of Zn2Si0.5Ge0.5O4: Mn thin-film electroluminescent devices

(2003) JOURNAL OF APPLIED PHYSICS. 93(8). p.4622-4627
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Chicago
STUYVEN, G, Patrick De Visschere, Kristiaan Neyts, and A KITAI. 2003. “Characterization of the Electro-optical Behavior of Zn2Si0.5Ge0.5O4: Mn Thin-film Electroluminescent Devices.” Journal of Applied Physics 93 (8): 4622–4627.
APA
STUYVEN, G., De Visschere, P., Neyts, K., & KITAI, A. (2003). Characterization of the electro-optical behavior of Zn2Si0.5Ge0.5O4: Mn thin-film electroluminescent devices. JOURNAL OF APPLIED PHYSICS, 93(8), 4622–4627.
Vancouver
1.
STUYVEN G, De Visschere P, Neyts K, KITAI A. Characterization of the electro-optical behavior of Zn2Si0.5Ge0.5O4: Mn thin-film electroluminescent devices. JOURNAL OF APPLIED PHYSICS. 2003;93(8):4622–7.
MLA
STUYVEN, G, Patrick De Visschere, Kristiaan Neyts, et al. “Characterization of the Electro-optical Behavior of Zn2Si0.5Ge0.5O4: Mn Thin-film Electroluminescent Devices.” JOURNAL OF APPLIED PHYSICS 93.8 (2003): 4622–4627. Print.
@article{208800,
  author       = {STUYVEN, G and De Visschere, Patrick and Neyts, Kristiaan and KITAI, A},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {8},
  pages        = {4622--4627},
  title        = {Characterization of the electro-optical behavior of Zn2Si0.5Ge0.5O4: Mn thin-film electroluminescent devices},
  volume       = {93},
  year         = {2003},
}

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