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A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers

W De Bosscher, Roland Vanmeirhaeghe, A De Laere, Willy Laflere and Felix Cardon (1988) SOLID-STATE ELECTRONICS. 31(5). p.945-951
Please use this url to cite or link to this publication:
author
organization
alternative title
A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi2/Si Schottky barriers
year
type
journalArticle (original)
publication status
published
subject
journal title
SOLID-STATE ELECTRONICS
Solid-State Electron.
volume
31
issue
5
pages
945 - 951
Web of Science type
Article
ISSN
0038-1101
DOI
10.1016/0038-1101(88)90049-4
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2085699
handle
http://hdl.handle.net/1854/LU-2085699
date created
2012-04-12 21:28:51
date last changed
2016-12-19 15:44:52
@article{2085699,
  author       = {De Bosscher, W and Vanmeirhaeghe, Roland and De Laere, A and Laflere, Willy and Cardon, Felix},
  issn         = {0038-1101},
  journal      = {SOLID-STATE ELECTRONICS},
  language     = {eng},
  number       = {5},
  pages        = {945--951},
  title        = {A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi\unmatched{2082}/Si Schottky barriers},
  url          = {http://dx.doi.org/10.1016/0038-1101(88)90049-4},
  volume       = {31},
  year         = {1988},
}

Chicago
De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, Willy Laflère, and Felix Cardon. 1988. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” Solid-state Electronics 31 (5): 945–951.
APA
De Bosscher, W., Vanmeirhaeghe, R., De Laere, A., Laflère, W., & Cardon, F. (1988). A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS, 31(5), 945–951.
Vancouver
1.
De Bosscher W, Vanmeirhaeghe R, De Laere A, Laflère W, Cardon F. A study of the electrical and interfacial properties of sputtered Ti/Si and sputtered TiSi₂/Si Schottky barriers. SOLID-STATE ELECTRONICS. 1988;31(5):945–51.
MLA
De Bosscher, W, Roland Vanmeirhaeghe, A De Laere, et al. “A Study of the Electrical and Interfacial Properties of Sputtered Ti/Si and Sputtered TiSi₂/Si Schottky Barriers.” SOLID-STATE ELECTRONICS 31.5 (1988): 945–951. Print.