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Defects introduced in InP by mechanical polishing and studied by means of Au- and Al-p-InP Schottky barriers

(1986) SOLID-STATE ELECTRONICS. 29(11). p.1109-1114
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Chicago
Van den Berghe, LMO, Roland Vanmeirhaeghe, Willy Laflere, and Felix Cardon. 1986. “Defects Introduced in InP by Mechanical Polishing and Studied by Means of Au- and Al-p-InP Schottky Barriers.” Solid-state Electronics 29 (11): 1109–1114.
APA
Van den Berghe, LMO, Vanmeirhaeghe, R., Laflere, W., & Cardon, F. (1986). Defects introduced in InP by mechanical polishing and studied by means of Au- and Al-p-InP Schottky barriers. SOLID-STATE ELECTRONICS, 29(11), 1109–1114.
Vancouver
1.
Van den Berghe L, Vanmeirhaeghe R, Laflere W, Cardon F. Defects introduced in InP by mechanical polishing and studied by means of Au- and Al-p-InP Schottky barriers. SOLID-STATE ELECTRONICS. 1986;29(11):1109–14.
MLA
Van den Berghe, LMO, Roland Vanmeirhaeghe, Willy Laflere, et al. “Defects Introduced in InP by Mechanical Polishing and Studied by Means of Au- and Al-p-InP Schottky Barriers.” SOLID-STATE ELECTRONICS 29.11 (1986): 1109–1114. Print.
@article{2085682,
  author       = {Van den Berghe, LMO and Vanmeirhaeghe, Roland and Laflere, Willy and Cardon, Felix},
  issn         = {0038-1101},
  journal      = {SOLID-STATE ELECTRONICS},
  language     = {eng},
  number       = {11},
  pages        = {1109--1114},
  title        = {Defects introduced in InP by mechanical polishing and studied by means of Au- and Al-p-InP Schottky barriers},
  url          = {http://dx.doi.org/10.1016/0038-1101(86)90053-5},
  volume       = {29},
  year         = {1986},
}

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