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On the interpretation of solid-state coulometry, used in studies of thin-films of copper-sulphide

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Chicago
Vervaet, Alfons, Marc Burgelman, and Ivan Clemminck. 1989. “On the Interpretation of Solid-state Coulometry, Used in Studies of Thin-films of Copper-sulphide.” Journal of Materials Science Letters 8 (1): 69–70.
APA
Vervaet, A., Burgelman, M., & Clemminck, I. (1989). On the interpretation of solid-state coulometry, used in studies of thin-films of copper-sulphide. JOURNAL OF MATERIALS SCIENCE LETTERS, 8(1), 69–70.
Vancouver
1.
Vervaet A, Burgelman M, Clemminck I. On the interpretation of solid-state coulometry, used in studies of thin-films of copper-sulphide. JOURNAL OF MATERIALS SCIENCE LETTERS. 1989;8(1):69–70.
MLA
Vervaet, Alfons, Marc Burgelman, and Ivan Clemminck. “On the Interpretation of Solid-state Coulometry, Used in Studies of Thin-films of Copper-sulphide.” JOURNAL OF MATERIALS SCIENCE LETTERS 8.1 (1989): 69–70. Print.
@article{207997,
  author       = {Vervaet, Alfons and Burgelman, Marc and Clemminck, Ivan},
  issn         = {0261-8028},
  journal      = {JOURNAL OF MATERIALS SCIENCE LETTERS},
  language     = {eng},
  number       = {1},
  pages        = {69--70},
  title        = {On the interpretation of solid-state coulometry, used in studies of thin-films of copper-sulphide},
  url          = {http://dx.doi.org/10.1007/BF00720255},
  volume       = {8},
  year         = {1989},
}

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