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Influence of electronic current on measurement of ion polarization in evaporated silicon-oxide

(1977) THIN SOLID FILMS. 42(1). p.81-89
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MLA
De Mey, Gilbert, and W Dewilde. “Influence of Electronic Current on Measurement of Ion Polarization in Evaporated Silicon-oxide.” THIN SOLID FILMS 42.1 (1977): 81–89. Print.
APA
De Mey, G., & Dewilde, W. (1977). Influence of electronic current on measurement of ion polarization in evaporated silicon-oxide. THIN SOLID FILMS, 42(1), 81–89.
Chicago author-date
De Mey, Gilbert, and W Dewilde. 1977. “Influence of Electronic Current on Measurement of Ion Polarization in Evaporated Silicon-oxide.” Thin Solid Films 42 (1): 81–89.
Chicago author-date (all authors)
De Mey, Gilbert, and W Dewilde. 1977. “Influence of Electronic Current on Measurement of Ion Polarization in Evaporated Silicon-oxide.” Thin Solid Films 42 (1): 81–89.
Vancouver
1.
De Mey G, Dewilde W. Influence of electronic current on measurement of ion polarization in evaporated silicon-oxide. THIN SOLID FILMS. 1977;42(1):81–9.
IEEE
[1]
G. De Mey and W. Dewilde, “Influence of electronic current on measurement of ion polarization in evaporated silicon-oxide,” THIN SOLID FILMS, vol. 42, no. 1, pp. 81–89, 1977.
@article{207762,
  author       = {De Mey, Gilbert and Dewilde, W},
  issn         = {0040-6090},
  journal      = {THIN SOLID FILMS},
  language     = {eng},
  number       = {1},
  pages        = {81--89},
  title        = {Influence of electronic current on measurement of ion polarization in evaporated silicon-oxide},
  url          = {http://dx.doi.org/10.1016/0040-6090(77)90080-3},
  volume       = {42},
  year         = {1977},
}

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