Influence of finite semiconductor thickness on thin-film transistor characteristics
- Author
- Herman Pauwels and Marc Burgelman (UGent)
- Organization
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-207739
- MLA
- Pauwels, Herman, and Marc Burgelman. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” THIN SOLID FILMS 27.2 (1975): 273–286. Print.
- APA
- Pauwels, Herman, & Burgelman, M. (1975). Influence of finite semiconductor thickness on thin-film transistor characteristics. THIN SOLID FILMS, 27(2), 273–286.
- Chicago author-date
- Pauwels, Herman, and Marc Burgelman. 1975. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” Thin Solid Films 27 (2): 273–286.
- Chicago author-date (all authors)
- Pauwels, Herman, and Marc Burgelman. 1975. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” Thin Solid Films 27 (2): 273–286.
- Vancouver
- 1.Pauwels H, Burgelman M. Influence of finite semiconductor thickness on thin-film transistor characteristics. THIN SOLID FILMS. 1975;27(2):273–86.
- IEEE
- [1]H. Pauwels and M. Burgelman, “Influence of finite semiconductor thickness on thin-film transistor characteristics,” THIN SOLID FILMS, vol. 27, no. 2, pp. 273–286, 1975.
@article{207739,
author = {Pauwels, Herman and Burgelman, Marc},
issn = {0040-6090},
journal = {THIN SOLID FILMS},
language = {eng},
number = {2},
pages = {273--286},
title = {Influence of finite semiconductor thickness on thin-film transistor characteristics},
url = {http://dx.doi.org/10.1016/0040-6090(75)90034-6},
volume = {27},
year = {1975},
}
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