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Influence of finite semiconductor thickness on thin-film transistor characteristics

(1975) THIN SOLID FILMS. 27(2). p.273-286
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MLA
Pauwels, Herman, and Marc Burgelman. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” THIN SOLID FILMS 27.2 (1975): 273–286. Print.
APA
Pauwels, Herman, & Burgelman, M. (1975). Influence of finite semiconductor thickness on thin-film transistor characteristics. THIN SOLID FILMS, 27(2), 273–286.
Chicago author-date
Pauwels, Herman, and Marc Burgelman. 1975. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” Thin Solid Films 27 (2): 273–286.
Chicago author-date (all authors)
Pauwels, Herman, and Marc Burgelman. 1975. “Influence of Finite Semiconductor Thickness on Thin-film Transistor Characteristics.” Thin Solid Films 27 (2): 273–286.
Vancouver
1.
Pauwels H, Burgelman M. Influence of finite semiconductor thickness on thin-film transistor characteristics. THIN SOLID FILMS. 1975;27(2):273–86.
IEEE
[1]
H. Pauwels and M. Burgelman, “Influence of finite semiconductor thickness on thin-film transistor characteristics,” THIN SOLID FILMS, vol. 27, no. 2, pp. 273–286, 1975.
@article{207739,
  author       = {Pauwels, Herman and Burgelman, Marc},
  issn         = {0040-6090},
  journal      = {THIN SOLID FILMS},
  language     = {eng},
  number       = {2},
  pages        = {273--286},
  title        = {Influence of finite semiconductor thickness on thin-film transistor characteristics},
  url          = {http://dx.doi.org/10.1016/0040-6090(75)90034-6},
  volume       = {27},
  year         = {1975},
}

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