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Theoretical influence of surface states and bulk traps on thin-film transistor characteristics

(1975) SOLID-STATE ELECTRONICS. 18(7-8). p.691-698
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Chicago
Van Calster, André, and Herman Pauwels. 1975. “Theoretical Influence of Surface States and Bulk Traps on Thin-film Transistor Characteristics.” Solid-state Electronics 18 (7-8): 691–698.
APA
Van Calster, A., & Pauwels, H. (1975). Theoretical influence of surface states and bulk traps on thin-film transistor characteristics. SOLID-STATE ELECTRONICS, 18(7-8), 691–698.
Vancouver
1.
Van Calster A, Pauwels H. Theoretical influence of surface states and bulk traps on thin-film transistor characteristics. SOLID-STATE ELECTRONICS. 1975;18(7-8):691–8.
MLA
Van Calster, André, and Herman Pauwels. “Theoretical Influence of Surface States and Bulk Traps on Thin-film Transistor Characteristics.” SOLID-STATE ELECTRONICS 18.7-8 (1975): 691–698. Print.
@article{207737,
  author       = {Van Calster, Andr{\'e} and Pauwels, Herman},
  issn         = {0038-1101},
  journal      = {SOLID-STATE ELECTRONICS},
  language     = {eng},
  number       = {7-8},
  pages        = {691--698},
  title        = {Theoretical influence of surface states and bulk traps on thin-film transistor characteristics},
  url          = {http://dx.doi.org/10.1016/0038-1101(75)90141-0},
  volume       = {18},
  year         = {1975},
}

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