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Carrier concentrations from MIS C-V measurements

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Chicago
Pauwels, Herman. 1973. “Carrier Concentrations from MIS C-V Measurements.” Ieee Transactions on Electron Devices ED20 (3): 332–333.
APA
Pauwels, Herman. (1973). Carrier concentrations from MIS C-V measurements. IEEE TRANSACTIONS ON ELECTRON DEVICES, ED20(3), 332–333.
Vancouver
1.
Pauwels H. Carrier concentrations from MIS C-V measurements. IEEE TRANSACTIONS ON ELECTRON DEVICES. 1973;ED20(3):332–3.
MLA
Pauwels, Herman. “Carrier Concentrations from MIS C-V Measurements.” IEEE TRANSACTIONS ON ELECTRON DEVICES ED20.3 (1973): 332–333. Print.
@article{207709,
  author       = {Pauwels, Herman},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {3},
  pages        = {332--333},
  title        = {Carrier concentrations from MIS C-V measurements},
  url          = {http://dx.doi.org/10.1109/T-ED.1973.17650},
  volume       = {ED20},
  year         = {1973},
}

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