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A method for continuously measuring the pinch-off voltage shift of fet structures

S Meirsschaut (1970) IEEE TRANSACTIONS ON ELECTRON DEVICES. 17(10). p.943-944
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (letterNote)
publication status
published
subject
journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
IEEE Trans. Electron Devices
volume
17
issue
10
pages
943 - 944
Web of Science type
Letter
ISSN
0018-9383
DOI
10.1109/T-ED.1970.17101
language
English
UGent publication?
yes
classification
A1
id
207694
handle
http://hdl.handle.net/1854/LU-207694
date created
2004-01-26 14:34:00
date last changed
2016-12-19 15:38:01
@article{207694,
  author       = {Meirsschaut, S},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {10},
  pages        = {943--944},
  title        = {A method for continuously measuring the pinch-off voltage shift of fet structures},
  url          = {http://dx.doi.org/10.1109/T-ED.1970.17101},
  volume       = {17},
  year         = {1970},
}

Chicago
Meirsschaut, S. 1970. “A Method for Continuously Measuring the Pinch-off Voltage Shift of Fet Structures.” Ieee Transactions on Electron Devices 17 (10): 943–944.
APA
Meirsschaut, S. (1970). A method for continuously measuring the pinch-off voltage shift of fet structures. IEEE TRANSACTIONS ON ELECTRON DEVICES, 17(10), 943–944.
Vancouver
1.
Meirsschaut S. A method for continuously measuring the pinch-off voltage shift of fet structures. IEEE TRANSACTIONS ON ELECTRON DEVICES. 1970;17(10):943–4.
MLA
Meirsschaut, S. “A Method for Continuously Measuring the Pinch-off Voltage Shift of Fet Structures.” IEEE TRANSACTIONS ON ELECTRON DEVICES 17.10 (1970): 943–944. Print.