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A method for continuously measuring the pinch-off voltage shift of fet structures

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Chicago
Meirsschaut, S. 1970. “A Method for Continuously Measuring the Pinch-off Voltage Shift of Fet Structures.” Ieee Transactions on Electron Devices 17 (10): 943–944.
APA
Meirsschaut, S. (1970). A method for continuously measuring the pinch-off voltage shift of fet structures. IEEE TRANSACTIONS ON ELECTRON DEVICES, 17(10), 943–944.
Vancouver
1.
Meirsschaut S. A method for continuously measuring the pinch-off voltage shift of fet structures. IEEE TRANSACTIONS ON ELECTRON DEVICES. 1970;17(10):943–4.
MLA
Meirsschaut, S. “A Method for Continuously Measuring the Pinch-off Voltage Shift of Fet Structures.” IEEE TRANSACTIONS ON ELECTRON DEVICES 17.10 (1970): 943–944. Print.
@article{207694,
  author       = {Meirsschaut, S},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {10},
  pages        = {943--944},
  title        = {A method for continuously measuring the pinch-off voltage shift of fet structures},
  url          = {http://dx.doi.org/10.1109/T-ED.1970.17101},
  volume       = {17},
  year         = {1970},
}

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