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INTERLABORATORY DETERMINATION OF OXYGEN IN SILICON FOR CERTIFIED REFERENCE MATERIALS.

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Chicago
MURRAY, R, K GRAFF, B PAJOT, Karel Strijckmans, S VANDENDRIESSCHE, B GRIEPINK, and H MARCHANDISE. 1992. “Interlaboratory Determination of Oxygen in Silicon for Certified Reference Materials.” Journal of the Electrochemical Society 139 (12): 3582–3587.
APA
MURRAY, R., GRAFF, K., PAJOT, B., Strijckmans, K., VANDENDRIESSCHE, S., GRIEPINK, B., & MARCHANDISE, H. (1992). INTERLABORATORY DETERMINATION OF OXYGEN IN SILICON FOR CERTIFIED REFERENCE MATERIALS. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 139(12), 3582–3587.
Vancouver
1.
MURRAY R, GRAFF K, PAJOT B, Strijckmans K, VANDENDRIESSCHE S, GRIEPINK B, et al. INTERLABORATORY DETERMINATION OF OXYGEN IN SILICON FOR CERTIFIED REFERENCE MATERIALS. JOURNAL OF THE ELECTROCHEMICAL SOCIETY. 1992;139(12):3582–7.
MLA
MURRAY, R, K GRAFF, B PAJOT, et al. “Interlaboratory Determination of Oxygen in Silicon for Certified Reference Materials.” JOURNAL OF THE ELECTROCHEMICAL SOCIETY 139.12 (1992): 3582–3587. Print.
@article{207532,
  author       = {MURRAY, R and GRAFF, K and PAJOT, B and Strijckmans, Karel and VANDENDRIESSCHE, S and GRIEPINK, B and MARCHANDISE, H},
  issn         = {0013-4651},
  journal      = {JOURNAL OF THE ELECTROCHEMICAL SOCIETY},
  language     = {eng},
  number       = {12},
  pages        = {3582--3587},
  title        = {INTERLABORATORY DETERMINATION OF OXYGEN IN SILICON FOR CERTIFIED REFERENCE MATERIALS.},
  volume       = {139},
  year         = {1992},
}