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Real-time portable system for fabric defect detection using an ARM processor

Jose Armando Fernandez Gallego, Juan Pablo Yanez Puentes, Benhur Ortiz Jaramillo UGent, Jorge Alvarez Triana, Sergio Alejandro Orjuela Vargas UGent and Wilfried Philips UGent (2012) PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 8436.
abstract
Modern textile industry seeks to produce textiles as little defective as possible since the presence of defects can decrease the final price of products from 45% to 65%. Automated visual inspection (AVI) systems, based on image analysis, have become an important alternative for replacing traditional inspections methods that involve human tasks. An AVI system gives the advantage of repeatability when implemented within defined constrains, offering more objective and reliable results for particular tasks than human inspection. Costs of automated inspection systems development can be reduced using modular solutions with embedded systems, in which an important advantage is the low energy consumption. Among the possibilities for developing embedded systems, the ARM processor has been explored for acquisition, monitoring and simple signal processing tasks. In a recent approach we have explored the use of the ARM processor for defects detection by implementing the wavelet transform. However, the computation speed of the preprocessing was not yet sufficient for real time applications. In this approach we significantly improve the preprocessing speed of the algorithm, by optimizing matrix operations, such that it is adequate for a real time application. The system was tested for defect detection using different defect types. The paper is focused in giving a detailed description of the basis of the algorithm implementation, such that other algorithms may use of the ARM operations for fast implementations.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
wavelet transform, texture analysis, floating point, embedded system, defect detection, ARMv4, CLASSIFICATION, COMPUTER-VISION
in
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Proc. SPIE Int. Soc. Opt. Eng.
editor
P Schelkens, T Ebrahimi, G Cristobal, F Truchetet and P Saarikko
volume
8436
article_number
84361I
pages
9 pages
publisher
SPIE
place of publication
Brussels, Belgium
conference name
Conference on Optics, Photonics and Digital Technologies for Multimedia Applications II
conference location
Brussels, Belgium
conference start
2012-04-16
conference end
2012-04-19
Web of Science type
Proceedings Paper
Web of Science id
000305508300049
ISSN
0277-786X
ISBN
9780819491282
DOI
10.1117/12.923229
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2072008
handle
http://hdl.handle.net/1854/LU-2072008
date created
2012-03-21 16:27:55
date last changed
2013-10-22 11:06:14
@inproceedings{2072008,
  abstract     = {Modern textile industry seeks to produce textiles as little defective as possible since the presence of defects can decrease the final price of products from 45\% to 65\%. Automated visual inspection (AVI) systems, based on image analysis, have become an important alternative for replacing traditional inspections methods that involve human tasks. An AVI system gives the advantage of repeatability when implemented within defined constrains, offering more objective and reliable results for particular tasks than human inspection. Costs of automated inspection systems development can be reduced using modular solutions with embedded systems, in which an important advantage is the low energy consumption. Among the possibilities for developing embedded systems, the ARM processor has been explored for acquisition, monitoring and simple signal processing tasks. In a recent approach we have explored the use of the ARM processor for defects detection by implementing the wavelet transform. However, the computation speed of the preprocessing was not yet sufficient for real time applications. In this approach we significantly improve the preprocessing speed of the algorithm, by optimizing matrix operations, such that it is adequate for a real time application. The system was tested for defect detection using different defect types. The paper is focused in giving a detailed description of the basis of the algorithm implementation, such that other algorithms may use of the ARM operations for fast implementations.},
  articleno    = {84361I},
  author       = {Fernandez Gallego, Jose Armando  and Yanez Puentes, Juan Pablo and Ortiz Jaramillo, Benhur and Alvarez Triana, Jorge  and Orjuela Vargas, Sergio Alejandro and Philips, Wilfried},
  booktitle    = {PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING},
  editor       = {Schelkens, P and Ebrahimi, T and Cristobal, G and Truchetet, F and Saarikko, P },
  isbn         = {9780819491282},
  issn         = {0277-786X},
  keyword      = {wavelet transform,texture analysis,floating point,embedded system,defect detection,ARMv4,CLASSIFICATION,COMPUTER-VISION},
  language     = {eng},
  location     = {Brussels, Belgium},
  pages        = {9},
  publisher    = {SPIE},
  title        = {Real-time portable system for fabric defect detection using an ARM processor},
  url          = {http://dx.doi.org/10.1117/12.923229},
  volume       = {8436},
  year         = {2012},
}

Chicago
Fernandez Gallego, Jose Armando , Juan Pablo Yanez Puentes, Benhur Ortiz Jaramillo, Jorge Alvarez Triana, Sergio Alejandro Orjuela Vargas, and Wilfried Philips. 2012. “Real-time Portable System for Fabric Defect Detection Using an ARM Processor.” In Proceedings of Spie, the International Society for Optical Engineering, ed. P Schelkens, T Ebrahimi, G Cristobal, F Truchetet, and P Saarikko. Vol. 8436. Brussels, Belgium: SPIE.
APA
Fernandez Gallego, J. A., Yanez Puentes, J. P., Ortiz Jaramillo, B., Alvarez Triana, J., Orjuela Vargas, S. A., & Philips, W. (2012). Real-time portable system for fabric defect detection using an ARM processor. In P Schelkens, T. Ebrahimi, G. Cristobal, F. Truchetet, & P. Saarikko (Eds.), PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING (Vol. 8436). Presented at the Conference on Optics, Photonics and Digital Technologies for Multimedia Applications II, Brussels, Belgium: SPIE.
Vancouver
1.
Fernandez Gallego JA, Yanez Puentes JP, Ortiz Jaramillo B, Alvarez Triana J, Orjuela Vargas SA, Philips W. Real-time portable system for fabric defect detection using an ARM processor. In: Schelkens P, Ebrahimi T, Cristobal G, Truchetet F, Saarikko P, editors. PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. Brussels, Belgium: SPIE; 2012.
MLA
Fernandez Gallego, Jose Armando , Juan Pablo Yanez Puentes, Benhur Ortiz Jaramillo, et al. “Real-time Portable System for Fabric Defect Detection Using an ARM Processor.” Proceedings of Spie, the International Society for Optical Engineering. Ed. P Schelkens et al. Vol. 8436. Brussels, Belgium: SPIE, 2012. Print.