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Measurement of low permittivity materials based on a spectral domain analysis for the open-ended coaxial probe.

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Chicago
De Langhe, Pascal, Krist Blomme, Luc Martens, and Daniël De Zutter. 1993. “Measurement of Low Permittivity Materials Based on a Spectral Domain Analysis for the Open-ended Coaxial Probe.” Ieee Transactions on Instrumentation and Measurement 42 (5): 879–886.
APA
De Langhe, P., Blomme, K., Martens, L., & De Zutter, D. (1993). Measurement of low permittivity materials based on a spectral domain analysis for the open-ended coaxial probe. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 42(5), 879–886.
Vancouver
1.
De Langhe P, Blomme K, Martens L, De Zutter D. Measurement of low permittivity materials based on a spectral domain analysis for the open-ended coaxial probe. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. 1993;42(5):879–86.
MLA
De Langhe, Pascal, Krist Blomme, Luc Martens, et al. “Measurement of Low Permittivity Materials Based on a Spectral Domain Analysis for the Open-ended Coaxial Probe.” IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 42.5 (1993): 879–886. Print.
@article{203381,
  author       = {De Langhe, Pascal and Blomme, Krist and Martens, Luc and De Zutter, Dani{\"e}l},
  issn         = {0018-9456},
  journal      = {IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT},
  language     = {eng},
  number       = {5},
  pages        = {879--886},
  title        = {Measurement of low permittivity materials based on a spectral domain analysis for the open-ended coaxial probe.},
  volume       = {42},
  year         = {1993},
}