Ghent University Academic Bibliography

Advanced

Fabric defect detection using the wavelet transform in an ARM processor

Jose Armando Fernández Gallego, Sergio Alejandro Orjuela Vargas UGent, Jorge Álvarez and Wilfried Philips UGent (2012) Proceedings of SPIE, the International Society for Optical Engineering. 8300.
abstract
Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations.
Please use this url to cite or link to this publication:
author
organization
year
type
conference (proceedingsPaper)
publication status
published
subject
keyword
texture analysis, image analysis, Experimental designs, FEATURES, TEXTURE CLASSIFICATION
in
Proceedings of SPIE, the International Society for Optical Engineering
Proc. SPIE Int. Soc. Opt. Eng.
editor
Philip R Bingham and Edmund Y Lam
volume
8300
issue title
Image processing : machine vision applications V
article number
83000N
pages
8 pages
publisher
SPIE, the International Society for Optical Engineering
place of publication
Bellingham, WA, USA
conference name
Conference on Image Processing - Machine Vision Applications V
conference location
Burlingame, CA, USA
conference start
2012-01-25
conference end
2012-01-25
Web of Science type
Proceedings Paper
Web of Science id
000304865800022
ISSN
0277-786X
ISBN
9780819489470
DOI
10.1117/12.909432
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
2010313
handle
http://hdl.handle.net/1854/LU-2010313
date created
2012-01-31 18:45:24
date last changed
2017-01-02 09:53:10
@inproceedings{2010313,
  abstract     = {Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95\% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations.},
  articleno    = {83000N},
  author       = { Fern{\'a}ndez Gallego, Jose Armando and Orjuela Vargas, Sergio Alejandro and {\'A}lvarez, Jorge  and Philips, Wilfried},
  booktitle    = {Proceedings of SPIE, the International Society for Optical Engineering},
  editor       = {Bingham, Philip R and Lam, Edmund Y},
  isbn         = {9780819489470},
  issn         = {0277-786X},
  keyword      = {texture analysis,image analysis,Experimental designs,FEATURES,TEXTURE CLASSIFICATION},
  language     = {eng},
  location     = {Burlingame, CA, USA},
  pages        = {8},
  publisher    = {SPIE, the International Society for Optical Engineering},
  title        = {Fabric defect detection using the wavelet transform in an ARM processor},
  url          = {http://dx.doi.org/10.1117/12.909432},
  volume       = {8300},
  year         = {2012},
}

Chicago
Fernández Gallego, Jose Armando, Sergio Alejandro Orjuela Vargas, Jorge Álvarez, and Wilfried Philips. 2012. “Fabric Defect Detection Using the Wavelet Transform in an ARM Processor.” In Proceedings of SPIE, the International Society for Optical Engineering, ed. Philip R Bingham and Edmund Y Lam. Vol. 8300. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
APA
Fernández Gallego, J. A., Orjuela Vargas, S. A., Álvarez, J., & Philips, W. (2012). Fabric defect detection using the wavelet transform in an ARM processor. In P. R. Bingham & E. Y. Lam (Eds.), Proceedings of SPIE, the International Society for Optical Engineering (Vol. 8300). Presented at the Conference on Image Processing - Machine Vision Applications V, Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
Vancouver
1.
Fernández Gallego JA, Orjuela Vargas SA, Álvarez J, Philips W. Fabric defect detection using the wavelet transform in an ARM processor. In: Bingham PR, Lam EY, editors. Proceedings of SPIE, the International Society for Optical Engineering. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering; 2012.
MLA
Fernández Gallego, Jose Armando, Sergio Alejandro Orjuela Vargas, Jorge Álvarez, et al. “Fabric Defect Detection Using the Wavelet Transform in an ARM Processor.” Proceedings of SPIE, the International Society for Optical Engineering. Ed. Philip R Bingham & Edmund Y Lam. Vol. 8300. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering, 2012. Print.