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Fabric defect detection using the wavelet transform in an ARM processor

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Abstract
Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations.
Keywords
texture analysis, image analysis, Experimental designs, FEATURES, TEXTURE CLASSIFICATION

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Chicago
Fernández Gallego, Jose Armando, Sergio Alejandro Orjuela Vargas, Jorge Álvarez, and Wilfried Philips. 2012. “Fabric Defect Detection Using the Wavelet Transform in an ARM Processor.” In Proceedings of SPIE, the International Society for Optical Engineering, ed. Philip R Bingham and Edmund Y Lam. Vol. 8300. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
APA
Fernández Gallego, J. A., Orjuela Vargas, S. A., Álvarez, J., & Philips, W. (2012). Fabric defect detection using the wavelet transform in an ARM processor. In P. R. Bingham & E. Y. Lam (Eds.), Proceedings of SPIE, the International Society for Optical Engineering (Vol. 8300). Presented at the Conference on Image Processing - Machine Vision Applications V, Bellingham, WA, USA: SPIE, the International Society for Optical Engineering.
Vancouver
1.
Fernández Gallego JA, Orjuela Vargas SA, Álvarez J, Philips W. Fabric defect detection using the wavelet transform in an ARM processor. In: Bingham PR, Lam EY, editors. Proceedings of SPIE, the International Society for Optical Engineering. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering; 2012.
MLA
Fernández Gallego, Jose Armando, Sergio Alejandro Orjuela Vargas, Jorge Álvarez, et al. “Fabric Defect Detection Using the Wavelet Transform in an ARM Processor.” Proceedings of SPIE, the International Society for Optical Engineering. Ed. Philip R Bingham & Edmund Y Lam. Vol. 8300. Bellingham, WA, USA: SPIE, the International Society for Optical Engineering, 2012. Print.
@inproceedings{2010313,
  abstract     = {Small devices used in our day life are constructed with powerful architectures that can be used for industrial applications when requiring portability and communication facilities. We present in this paper an example of the use of an embedded system, the Zeus epic 520 single board computer, for defect detection in textiles using image processing. We implement the Haar wavelet transform using the embedded visual C++ 4.0 compiler for Windows CE 5. The algorithm was tested for defect detection using images of fabrics with five types of defects. An average of 95\% in terms of correct defect detection was obtained, achieving a similar performance than using processors with float point arithmetic calculations.},
  articleno    = {83000N},
  author       = { Fern{\'a}ndez Gallego, Jose Armando and Orjuela Vargas, Sergio Alejandro and {\'A}lvarez, Jorge  and Philips, Wilfried},
  booktitle    = {Proceedings of SPIE, the International Society for Optical Engineering},
  editor       = {Bingham, Philip R and Lam, Edmund Y},
  isbn         = {9780819489470},
  issn         = {0277-786X},
  keyword      = {texture analysis,image analysis,Experimental designs,FEATURES,TEXTURE CLASSIFICATION},
  language     = {eng},
  location     = {Burlingame, CA, USA},
  pages        = {8},
  publisher    = {SPIE, the International Society for Optical Engineering},
  title        = {Fabric defect detection using the wavelet transform in an ARM processor},
  url          = {http://dx.doi.org/10.1117/12.909432},
  volume       = {8300},
  year         = {2012},
}

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