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fMRI pattern recognition: the influence of feature selection on various classifiers

Ruth Seurinck (UGent) , Beatrijs Moerkerke (UGent) , Simone Kühn (UGent) , Wim Fias (UGent) and Stefan Van Aelst (UGent)
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Chicago
Seurinck, Ruth, Beatrijs Moerkerke, Simone Kühn, Wim Fias, and Stefan Van Aelst. 2011. “fMRI Pattern Recognition: The Influence of Feature Selection on Various Classifiers.” In Berlin Workshop on Statistics and Neuroimaging 2011, Abstracts.
APA
Seurinck, Ruth, Moerkerke, B., Kühn, S., Fias, W., & Van Aelst, S. (2011). fMRI pattern recognition: the influence of feature selection on various classifiers. Berlin workshop on statistics and neuroimaging 2011, Abstracts. Presented at the Berlin Workshop on Statistics and Neuroimaging 2011.
Vancouver
1.
Seurinck R, Moerkerke B, Kühn S, Fias W, Van Aelst S. fMRI pattern recognition: the influence of feature selection on various classifiers. Berlin workshop on statistics and neuroimaging 2011, Abstracts. 2011.
MLA
Seurinck, Ruth, Beatrijs Moerkerke, Simone Kühn, et al. “fMRI Pattern Recognition: The Influence of Feature Selection on Various Classifiers.” Berlin Workshop on Statistics and Neuroimaging 2011, Abstracts. 2011. Print.
@inproceedings{2004866,
  author       = {Seurinck, Ruth and Moerkerke, Beatrijs and K{\"u}hn, Simone and Fias, Wim and Van Aelst, Stefan},
  booktitle    = {Berlin workshop on statistics and neuroimaging 2011, Abstracts},
  language     = {eng},
  location     = {Berlin, Germany},
  title        = {fMRI pattern recognition: the influence of feature selection on various classifiers},
  year         = {2011},
}