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Total reflection X-ray fluorescence in the ultramicro analysis of artists' pigments

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Abstract
The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflection X-ray fluorescence analysis makes possible the non-destructive analysis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of art.
Keywords
MICROANALYSIS

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Citation

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MLA
Moens, Luc, et al. “Total Reflection X-Ray Fluorescence in the Ultramicro Analysis of Artists’ Pigments.” TRAC-TRENDS IN ANALYTICAL CHEMISTRY, vol. 13, no. 5, 1994, pp. 198–205.
APA
Moens, L., Devos, W., Klockenkämper, R., & von Bohlen, A. (1994). Total reflection X-ray fluorescence in the ultramicro analysis of artists’ pigments. TRAC-TRENDS IN ANALYTICAL CHEMISTRY, 13(5), 198–205.
Chicago author-date
Moens, Luc, Wim Devos, Reinhold Klockenkämper, and Alex von Bohlen. 1994. “Total Reflection X-Ray Fluorescence in the Ultramicro Analysis of Artists’ Pigments.” TRAC-TRENDS IN ANALYTICAL CHEMISTRY 13 (5): 198–205.
Chicago author-date (all authors)
Moens, Luc, Wim Devos, Reinhold Klockenkämper, and Alex von Bohlen. 1994. “Total Reflection X-Ray Fluorescence in the Ultramicro Analysis of Artists’ Pigments.” TRAC-TRENDS IN ANALYTICAL CHEMISTRY 13 (5): 198–205.
Vancouver
1.
Moens L, Devos W, Klockenkämper R, von Bohlen A. Total reflection X-ray fluorescence in the ultramicro analysis of artists’ pigments. TRAC-TRENDS IN ANALYTICAL CHEMISTRY. 1994;13(5):198–205.
IEEE
[1]
L. Moens, W. Devos, R. Klockenkämper, and A. von Bohlen, “Total reflection X-ray fluorescence in the ultramicro analysis of artists’ pigments,” TRAC-TRENDS IN ANALYTICAL CHEMISTRY, vol. 13, no. 5, pp. 198–205, 1994.
@article{197792,
  abstract     = {The analytical characterization of artists' pigments is very important for art history and for restoration and conservation. Total reflection X-ray fluorescence analysis makes possible the non-destructive analysis of pigments. This new approach complements existing techniques and is unique in being at the same time accurate, fast, inexpensive, and well suited to the screening of pigments used in historical works of art.},
  author       = {Moens, Luc and Devos, Wim and Klockenkämper, Reinhold and von Bohlen, Alex},
  issn         = {0165-9936},
  journal      = {TRAC-TRENDS IN ANALYTICAL CHEMISTRY},
  keywords     = {MICROANALYSIS},
  language     = {eng},
  number       = {5},
  pages        = {198--205},
  title        = {Total reflection X-ray fluorescence in the ultramicro analysis of artists' pigments},
  url          = {http://dx.doi.org/10.1016/0165-9936(94)85039-9},
  volume       = {13},
  year         = {1994},
}

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