Advanced search
2 files | 956.53 KB

Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology

(2011) OPTICS LETTERS. 36(13). p.2450-2452
Author
Organization
Project
Center for nano- and biophotonics (NB-Photonics)

Downloads

  • 4840 i.pdf
    • full text
    • |
    • open access
    • |
    • PDF
    • |
    • 372.93 KB
  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 583.60 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Kumar, Rajesh, Thijs Spuesens, Pauline Mechet, Pragati Kumar, Oded Raz, Nicolas Olivier, Jean-Marc Fedeli, et al. 2011. “Ultrafast and Bias-free All-optical Wavelength Conversion Using III-V-on-silicon Technology.” Optics Letters 36 (13): 2450–2452.
APA
Kumar, R., Spuesens, T., Mechet, P., Kumar, P., Raz, O., Olivier, N., Fedeli, J.-M., et al. (2011). Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology. OPTICS LETTERS, 36(13), 2450–2452.
Vancouver
1.
Kumar R, Spuesens T, Mechet P, Kumar P, Raz O, Olivier N, et al. Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology. OPTICS LETTERS. 2011;36(13):2450–2.
MLA
Kumar, Rajesh, Thijs Spuesens, Pauline Mechet, et al. “Ultrafast and Bias-free All-optical Wavelength Conversion Using III-V-on-silicon Technology.” OPTICS LETTERS 36.13 (2011): 2450–2452. Print.
@article{1958207,
  author       = {Kumar, Rajesh and Spuesens, Thijs and Mechet, Pauline and Kumar, Pragati and Raz, Oded and Olivier, Nicolas and Fedeli, Jean-Marc and Roelkens, G{\"u}nther and Baets, Roel and Van Thourhout, Dries and Morthier, Geert},
  issn         = {0146-9592},
  journal      = {OPTICS LETTERS},
  language     = {eng},
  number       = {13},
  pages        = {2450--2452},
  title        = {Ultrafast and bias-free all-optical wavelength conversion using III-V-on-silicon technology},
  url          = {http://dx.doi.org/10.1364/OL.36.002450},
  volume       = {36},
  year         = {2011},
}

Altmetric
View in Altmetric
Web of Science
Times cited: