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A method for evaluating the frequence characteristics of ac thin film electroluminescent devices.

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Chicago
WANG, ZX, and Felix Cardon. 1995. “A Method for Evaluating the Frequence Characteristics of Ac Thin Film Electroluminescent Devices.” Journal of Physics D-applied Physics 28 (10): 2144–2149.
APA
WANG, ZX, & Cardon, F. (1995). A method for evaluating the frequence characteristics of ac thin film electroluminescent devices. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 28(10), 2144–2149.
Vancouver
1.
WANG Z, Cardon F. A method for evaluating the frequence characteristics of ac thin film electroluminescent devices. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 1995;28(10):2144–9.
MLA
WANG, ZX, and Felix Cardon. “A Method for Evaluating the Frequence Characteristics of Ac Thin Film Electroluminescent Devices.” JOURNAL OF PHYSICS D-APPLIED PHYSICS 28.10 (1995): 2144–2149. Print.
@article{195724,
  author       = {WANG, ZX and Cardon, Felix},
  issn         = {0022-3727},
  journal      = {JOURNAL OF PHYSICS D-APPLIED PHYSICS},
  language     = {eng},
  number       = {10},
  pages        = {2144--2149},
  title        = {A method for evaluating the frequence characteristics of ac thin film electroluminescent devices.},
  volume       = {28},
  year         = {1995},
}