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ANGLE-RESOLVED AND DEPTH PROFILING XPS INVESTIGATION OF A MONOLAYER NIOBIUM OXIDE CATALYST.

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Chicago
Verpoort, Francis, G DEDONCKER, AR BOSSUYT, Lucien Fiermans, and Ludo Verdonck. 1995. “Angle-resolved and Depth Profiling Xps Investigation of A Monolayer Niobium Oxide Catalyst.” Journal of Electron Spectroscopy and Related Phenomena 73 (3): 271–281.
APA
Verpoort, F., DEDONCKER, G., BOSSUYT, A., Fiermans, L., & Verdonck, L. (1995). ANGLE-RESOLVED AND DEPTH PROFILING XPS INVESTIGATION OF A MONOLAYER NIOBIUM OXIDE CATALYST. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 73(3), 271–281.
Vancouver
1.
Verpoort F, DEDONCKER G, BOSSUYT A, Fiermans L, Verdonck L. ANGLE-RESOLVED AND DEPTH PROFILING XPS INVESTIGATION OF A MONOLAYER NIOBIUM OXIDE CATALYST. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 1995;73(3):271–81.
MLA
Verpoort, Francis, G DEDONCKER, AR BOSSUYT, et al. “Angle-resolved and Depth Profiling Xps Investigation of A Monolayer Niobium Oxide Catalyst.” JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA 73.3 (1995): 271–281. Print.
@article{195286,
  author       = {Verpoort, Francis and DEDONCKER, G and BOSSUYT, AR and Fiermans, Lucien and Verdonck, Ludo},
  issn         = {0368-2048},
  journal      = {JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA},
  language     = {eng},
  number       = {3},
  pages        = {271--281},
  title        = {ANGLE-RESOLVED AND DEPTH PROFILING XPS INVESTIGATION OF A MONOLAYER NIOBIUM OXIDE CATALYST.},
  volume       = {73},
  year         = {1995},
}