Ghent University Academic Bibliography

Advanced

Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110

Math HJ Bollen, Robert Neumann, José Romero Gordon, Sasa Z Djokic, Kurt Stockman UGent, Jovica V Milanovic and Gaetan Ethier (2011) EPQU2011, Proceedings.
abstract
This paper presents some of the results from an international working group on voltage-dip immunity. The working group has made a number of recommendations to reduce the adverse impact of voltage dips. Specific recommendations to researchers and manufacturers of powerelectronic equipment are considering all voltage dip characteristics early in the design of equipment; characterize performance of equipment by means of voltage-dip immunity curves; and made equipment with different immunity available.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
electromagnetic compatibility, Power Quality
in
EPQU2011, Proceedings
pages
6 pages
publisher
IEEE
place of publication
New York, NY, USA
conference name
IEEE 11th International conference on Electrical Power Quality and Utilization (EPQU 2011)
conference location
Lisbon, Portugal
conference start
2011-10-17
conference end
2011-10-19
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1937908
handle
http://hdl.handle.net/1854/LU-1937908
date created
2011-10-28 14:10:40
date last changed
2011-11-04 13:03:59
@inproceedings{1937908,
  abstract     = {This paper presents some of the results from an international working group on voltage-dip immunity. The working group has made a number of recommendations to reduce the adverse impact of voltage dips. Specific recommendations to researchers and manufacturers of powerelectronic equipment are considering all voltage dip characteristics early in the design of equipment; characterize performance of equipment by means of voltage-dip immunity curves; and made equipment with different immunity available.},
  author       = {Bollen, Math HJ and Neumann, Robert and Romero Gordon, Jos{\'e} and Djokic, Sasa Z and Stockman, Kurt and Milanovic, Jovica V and Ethier, Gaetan},
  booktitle    = {EPQU2011, Proceedings},
  keyword      = {electromagnetic compatibility,Power Quality},
  language     = {eng},
  location     = {Lisbon, Portugal},
  pages        = {6},
  publisher    = {IEEE},
  title        = {Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110},
  year         = {2011},
}

Chicago
Bollen, Math HJ, Robert Neumann, José Romero Gordon, Sasa Z Djokic, Kurt Stockman, Jovica V Milanovic, and Gaetan Ethier. 2011. “Voltage Dip Immunity Aspects of Power-electronic Equipment: Recommendations from CIGRE/CIRED/UIE JWG C4.110.” In EPQU2011, Proceedings. New York, NY, USA: IEEE.
APA
Bollen, M. H., Neumann, R., Romero Gordon, J., Djokic, S. Z., Stockman, K., Milanovic, J. V., & Ethier, G. (2011). Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110. EPQU2011, Proceedings. Presented at the IEEE 11th International conference on Electrical Power Quality and Utilization (EPQU 2011), New York, NY, USA: IEEE.
Vancouver
1.
Bollen MH, Neumann R, Romero Gordon J, Djokic SZ, Stockman K, Milanovic JV, et al. Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110. EPQU2011, Proceedings. New York, NY, USA: IEEE; 2011.
MLA
Bollen, Math HJ, Robert Neumann, José Romero Gordon, et al. “Voltage Dip Immunity Aspects of Power-electronic Equipment: Recommendations from CIGRE/CIRED/UIE JWG C4.110.” EPQU2011, Proceedings. New York, NY, USA: IEEE, 2011. Print.