Advanced search
1 file | 117.19 KB

Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110

Author
Organization
Abstract
This paper presents some of the results from an international working group on voltage-dip immunity. The working group has made a number of recommendations to reduce the adverse impact of voltage dips. Specific recommendations to researchers and manufacturers of powerelectronic equipment are considering all voltage dip characteristics early in the design of equipment; characterize performance of equipment by means of voltage-dip immunity curves; and made equipment with different immunity available.
Keywords
electromagnetic compatibility, Power Quality

Downloads

  • Bollen-Neumann C4-110 voltage-dip-immunity.pdf
    • full text
    • |
    • open access
    • |
    • PDF
    • |
    • 117.19 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Bollen, Math HJ, Robert Neumann, José Romero Gordon, Sasa Z Djokic, Kurt Stockman, Jovica V Milanovic, and Gaetan Ethier. 2011. “Voltage Dip Immunity Aspects of Power-electronic Equipment: Recommendations from CIGRE/CIRED/UIE JWG C4.110.” In EPQU2011, Proceedings. New York, NY, USA: IEEE.
APA
Bollen, M. H., Neumann, R., Romero Gordon, J., Djokic, S. Z., Stockman, K., Milanovic, J. V., & Ethier, G. (2011). Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110. EPQU2011, Proceedings. Presented at the IEEE 11th International conference on Electrical Power Quality and Utilization (EPQU 2011), New York, NY, USA: IEEE.
Vancouver
1.
Bollen MH, Neumann R, Romero Gordon J, Djokic SZ, Stockman K, Milanovic JV, et al. Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110. EPQU2011, Proceedings. New York, NY, USA: IEEE; 2011.
MLA
Bollen, Math HJ, Robert Neumann, José Romero Gordon, et al. “Voltage Dip Immunity Aspects of Power-electronic Equipment: Recommendations from CIGRE/CIRED/UIE JWG C4.110.” EPQU2011, Proceedings. New York, NY, USA: IEEE, 2011. Print.
@inproceedings{1937908,
  abstract     = {This paper presents some of the results from an international working group on voltage-dip immunity. The working group has made a number of recommendations to reduce the adverse impact of voltage dips. Specific recommendations to researchers and manufacturers of powerelectronic equipment are considering all voltage dip characteristics early in the design of equipment; characterize performance of equipment by means of voltage-dip immunity curves; and made equipment with different immunity available.},
  author       = {Bollen, Math HJ and Neumann, Robert and Romero Gordon, Jos{\'e} and Djokic, Sasa Z and Stockman, Kurt and Milanovic, Jovica V and Ethier, Gaetan},
  booktitle    = {EPQU2011, Proceedings},
  keyword      = {electromagnetic compatibility,Power Quality},
  language     = {eng},
  location     = {Lisbon, Portugal},
  pages        = {6},
  publisher    = {IEEE},
  title        = {Voltage dip immunity aspects of power-electronic equipment: recommendations from CIGRE/CIRED/UIE JWG C4.110},
  year         = {2011},
}