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Microwave small-signal modelling of FinFETs using multi-parameter rational fitting method

Dirk Deschrijver UGent, G Avolio, D Schreurs, Tom Dhaene UGent, G Crupi and Luc Knockaert UGent (2011) ELECTRONICS LETTERS. 47(19). p.1084-1085
abstract
An effective approach based on a multi-parameter rational fitting technique is proposed to model the microwave small-signal response of active solid-state devices. The model is identified by fitting multibias scattering-parameter measurements and its analytical expression is implemented in a commercial microwave circuit simulator. The approach has been applied to the modelling of a silicon-based FinFET, and an excellent agreement is obtained between the measured data and model predictions.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
IBCN
journal title
ELECTRONICS LETTERS
Electron. Lett.
volume
47
issue
19
pages
1084 - 1085
Web of Science type
Article
Web of Science id
000294840800019
JCR category
ENGINEERING, ELECTRICAL & ELECTRONIC
JCR impact factor
0.965 (2011)
JCR rank
131/244 (2011)
JCR quartile
3 (2011)
ISSN
0013-5194
DOI
10.1049/el.2011.2394
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1937628
handle
http://hdl.handle.net/1854/LU-1937628
date created
2011-10-28 10:07:29
date last changed
2012-07-03 09:52:31
@article{1937628,
  abstract     = {An effective approach based on a multi-parameter rational fitting technique is proposed to model the microwave small-signal response of active solid-state devices. The model is identified by fitting multibias scattering-parameter measurements and its analytical expression is implemented in a commercial microwave circuit simulator. The approach has been applied to the modelling of a silicon-based FinFET, and an excellent agreement is obtained between the measured data and model predictions.},
  author       = {Deschrijver, Dirk and Avolio, G and Schreurs, D and Dhaene, Tom and Crupi, G and Knockaert, Luc},
  issn         = {0013-5194},
  journal      = {ELECTRONICS LETTERS},
  keyword      = {IBCN},
  language     = {eng},
  number       = {19},
  pages        = {1084--1085},
  title        = {Microwave small-signal modelling of FinFETs using multi-parameter rational fitting method},
  url          = {http://dx.doi.org/10.1049/el.2011.2394},
  volume       = {47},
  year         = {2011},
}

Chicago
Deschrijver, Dirk, G Avolio, D Schreurs, Tom Dhaene, G Crupi, and Luc Knockaert. 2011. “Microwave Small-signal Modelling of FinFETs Using Multi-parameter Rational Fitting Method.” Electronics Letters 47 (19): 1084–1085.
APA
Deschrijver, D., Avolio, G., Schreurs, D., Dhaene, T., Crupi, G., & Knockaert, L. (2011). Microwave small-signal modelling of FinFETs using multi-parameter rational fitting method. ELECTRONICS LETTERS, 47(19), 1084–1085.
Vancouver
1.
Deschrijver D, Avolio G, Schreurs D, Dhaene T, Crupi G, Knockaert L. Microwave small-signal modelling of FinFETs using multi-parameter rational fitting method. ELECTRONICS LETTERS. 2011;47(19):1084–5.
MLA
Deschrijver, Dirk, G Avolio, D Schreurs, et al. “Microwave Small-signal Modelling of FinFETs Using Multi-parameter Rational Fitting Method.” ELECTRONICS LETTERS 47.19 (2011): 1084–1085. Print.