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The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg-Y-O thin films

(2011) THIN SOLID FILMS. 519(16). p.5388-5396
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Keywords
Sputtering, LAYERS, X-ray diffraction, Magnesium oxide, Yttrium oxide, Molecular dynamics, Electron microscopy, TEMPERATURE, ENERGY, DEPOSITION, BIAXIAL ALIGNMENT, GRAIN-GROWTH, PREFERRED ORIENTATION, Y2O3, MODEL, OXIDES

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Citation

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MLA
Jehanathan, N, V Georgieva, Marta Martins Saraiva, et al. “The Influence of Cr and Y on the Micro Structural Evolution of Mg―Cr―O and Mg-Y-O Thin Films.” THIN SOLID FILMS 519.16 (2011): 5388–5396. Print.
APA
Jehanathan, N., Georgieva, V., Martins Saraiva, M., Depla, D., Bogaerts, A., & Van Tendeloo, G. (2011). The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg-Y-O thin films. THIN SOLID FILMS, 519(16), 5388–5396.
Chicago author-date
Jehanathan, N, V Georgieva, Marta Martins Saraiva, Diederik Depla, A Bogaerts, and G Van Tendeloo. 2011. “The Influence of Cr and Y on the Micro Structural Evolution of Mg―Cr―O and Mg-Y-O Thin Films.” Thin Solid Films 519 (16): 5388–5396.
Chicago author-date (all authors)
Jehanathan, N, V Georgieva, Marta Martins Saraiva, Diederik Depla, A Bogaerts, and G Van Tendeloo. 2011. “The Influence of Cr and Y on the Micro Structural Evolution of Mg―Cr―O and Mg-Y-O Thin Films.” Thin Solid Films 519 (16): 5388–5396.
Vancouver
1.
Jehanathan N, Georgieva V, Martins Saraiva M, Depla D, Bogaerts A, Van Tendeloo G. The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg-Y-O thin films. THIN SOLID FILMS. 2011;519(16):5388–96.
IEEE
[1]
N. Jehanathan, V. Georgieva, M. Martins Saraiva, D. Depla, A. Bogaerts, and G. Van Tendeloo, “The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg-Y-O thin films,” THIN SOLID FILMS, vol. 519, no. 16, pp. 5388–5396, 2011.
@article{1934676,
  author       = {Jehanathan, N and Georgieva, V and Martins Saraiva, Marta and Depla, Diederik and Bogaerts, A and Van Tendeloo, G},
  issn         = {0040-6090},
  journal      = {THIN SOLID FILMS},
  keywords     = {Sputtering,LAYERS,X-ray diffraction,Magnesium oxide,Yttrium oxide,Molecular dynamics,Electron microscopy,TEMPERATURE,ENERGY,DEPOSITION,BIAXIAL ALIGNMENT,GRAIN-GROWTH,PREFERRED ORIENTATION,Y2O3,MODEL,OXIDES},
  language     = {eng},
  number       = {16},
  pages        = {5388--5396},
  title        = {The influence of Cr and Y on the micro structural evolution of Mg―Cr―O and Mg-Y-O thin films},
  url          = {http://dx.doi.org/10.1016/j.tsf.2011.02.050},
  volume       = {519},
  year         = {2011},
}

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