Testing a multivariate model for wavelet coefficients
- Author
- Roland Kwitt, Peter Meerwald, Andreas Uhl and Geert Verdoolaege (UGent)
- Organization
- Abstract
- In this paper, we introduce a Goodness-of-Fit test for the Multivariate Exponential Power (MEP) distribution, a multivariate extension of the Generalized Gaussian, which has recently gained considerable interest as a model for wavelet coefficients in the context of color image retrieval and spread-spectrum watermarking. We present a size and power study of this test and show Goodness-of-Fit results for wavelet coefficients of natural and texture images from various popular databases.
- Keywords
- Wavelet transform, Multivariate modeling, Hypothesis testing
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-1934398
- MLA
- Kwitt, Roland, et al. “Testing a Multivariate Model for Wavelet Coefficients.” IEEE International Conference on Image Processing ICIP, IEEE, 2011, pp. 1301–04.
- APA
- Kwitt, R., Meerwald, P., Uhl, A., & Verdoolaege, G. (2011). Testing a multivariate model for wavelet coefficients. IEEE International Conference on Image Processing ICIP, 1301–1304. New York, NY, USA: IEEE.
- Chicago author-date
- Kwitt, Roland, Peter Meerwald, Andreas Uhl, and Geert Verdoolaege. 2011. “Testing a Multivariate Model for Wavelet Coefficients.” In IEEE International Conference on Image Processing ICIP, 1301–4. New York, NY, USA: IEEE.
- Chicago author-date (all authors)
- Kwitt, Roland, Peter Meerwald, Andreas Uhl, and Geert Verdoolaege. 2011. “Testing a Multivariate Model for Wavelet Coefficients.” In IEEE International Conference on Image Processing ICIP, 1301–1304. New York, NY, USA: IEEE.
- Vancouver
- 1.Kwitt R, Meerwald P, Uhl A, Verdoolaege G. Testing a multivariate model for wavelet coefficients. In: IEEE International Conference on Image Processing ICIP. New York, NY, USA: IEEE; 2011. p. 1301–4.
- IEEE
- [1]R. Kwitt, P. Meerwald, A. Uhl, and G. Verdoolaege, “Testing a multivariate model for wavelet coefficients,” in IEEE International Conference on Image Processing ICIP, Brussels, Belgium, 2011, pp. 1301–1304.
@inproceedings{1934398,
abstract = {{In this paper, we introduce a Goodness-of-Fit test for the Multivariate Exponential Power (MEP) distribution, a multivariate extension of the Generalized Gaussian, which has recently gained considerable interest as a model for wavelet coefficients in the context of color image retrieval and spread-spectrum watermarking. We present a size and power study of this test and show Goodness-of-Fit results for wavelet coefficients of natural and texture images from various popular databases.}},
author = {{Kwitt, Roland and Meerwald, Peter and Uhl, Andreas and Verdoolaege, Geert}},
booktitle = {{IEEE International Conference on Image Processing ICIP}},
isbn = {{9781457713033}},
issn = {{1522-4880}},
keywords = {{Wavelet transform,Multivariate modeling,Hypothesis testing}},
language = {{eng}},
location = {{Brussels, Belgium}},
pages = {{1301--1304}},
publisher = {{IEEE}},
title = {{Testing a multivariate model for wavelet coefficients}},
year = {{2011}},
}