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Electrical-transport in (100)CoSi2/Si contacts.

(1995) JOURNAL OF APPLIED PHYSICS. 77(6). p.2525-2536
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Chicago
Lauwers, Albert, KK LARSEN, M VANHOVE, Ronald Verbeeck, K MAEX, M VANROSSUM, An Vercaemst, Roland Vanmeirhaeghe, and Felix Cardon. 1995. “Electrical-transport in (100)CoSi2/Si Contacts.” Journal of Applied Physics 77 (6): 2525–2536.
APA
Lauwers, A., LARSEN, K., VANHOVE, M., Verbeeck, R., MAEX, K., VANROSSUM, M., Vercaemst, A., et al. (1995). Electrical-transport in (100)CoSi2/Si contacts. JOURNAL OF APPLIED PHYSICS, 77(6), 2525–2536.
Vancouver
1.
Lauwers A, LARSEN K, VANHOVE M, Verbeeck R, MAEX K, VANROSSUM M, et al. Electrical-transport in (100)CoSi2/Si contacts. JOURNAL OF APPLIED PHYSICS. 1995;77(6):2525–36.
MLA
Lauwers, Albert, KK LARSEN, M VANHOVE, et al. “Electrical-transport in (100)CoSi2/Si Contacts.” JOURNAL OF APPLIED PHYSICS 77.6 (1995): 2525–2536. Print.
@article{192909,
  author       = {Lauwers, Albert and LARSEN, KK and VANHOVE, M and Verbeeck, Ronald and MAEX, K and VANROSSUM, M and Vercaemst, An and Vanmeirhaeghe, Roland and Cardon, Felix},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {6},
  pages        = {2525--2536},
  title        = {Electrical-transport in (100)CoSi2/Si contacts.},
  volume       = {77},
  year         = {1995},
}