Ghent University Academic Bibliography

Advanced

No-reference blur estimation based on the average cone ratio in the wavelet domain

Ljiljana Platisa UGent, Aleksandra Pizurica UGent, Ewout Vansteenkiste UGent and Wilfried Philips UGent (2011) PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. 7881.
abstract
With extensive technological advancements in electronic imaging today, high image quality is becoming an imperative necessity in the modern imaging systems. An important part of quality assurance are techniques for measuring the level of image distortion. Recently, we proposed a wavelet based metric of blurriness in the digital images named CogACR. The metric is highly robust to noise and able to distinguish between a great range of blurriness. Also, it can be used either when the reference degradation-free image is available or when it is unknown. However, the metric is content sensitive and thus in a no-reference scenario it was not fully automated. In this paper, we further investigate this problem. First, we propose a method to classify images based on edge content similarity. Next, we use this method to automate the CogACR estimation of blur in a no-reference scenario. Our results indicate high accuracy of the method for a range of natural scene images distorted with the out-of-focus blur. Within the considered range of blur radius of 0 to 10 pixels, varied in steps of 0.25 pixels, the proposed method estimates the blur radius with an absolute error of up to 1 pixel in 80 to 90% of the images.
Please use this url to cite or link to this publication:
author
organization
year
type
conference (proceedingsPaper)
publication status
published
subject
keyword
image quality, wavelets, blur estimation, MODEL, EDGES, SINGULARITY DETECTION
in
PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Proc. SPIE Int. Soc. Opt. Eng.
editor
D Akopian, R Creutzburg, CGM Snoek, N Sebe and L Kennedy
volume
7881
issue title
Multimedia on mobile devices 2011 and multimedia content access : algorithms and systems V
article number
78811D
pages
12 pages
publisher
SPIE
place of publication
Bellingham, WA, USA
conference name
Conference on Multimedia on Mobile Devices and Multimedia Content Access : Algorithms and Systems V
conference location
San Francisco, CA, USA
conference start
2011-01-23
conference end
2011-01-27
Web of Science type
Proceedings Paper
Web of Science id
000297561800035
ISSN
0277-786X
ISBN
9780819484185
DOI
10.1117/12.872836
language
English
UGent publication?
yes
classification
P1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1924995
handle
http://hdl.handle.net/1854/LU-1924995
date created
2011-10-12 17:09:46
date last changed
2017-01-02 09:52:11
@inproceedings{1924995,
  abstract     = {With extensive technological advancements in electronic imaging today, high image quality is becoming an imperative necessity in the modern imaging systems. An important part of quality assurance are techniques for measuring the level of image distortion. Recently, we proposed a wavelet based metric of blurriness in the digital images named CogACR. The metric is highly robust to noise and able to distinguish between a great range of blurriness. Also, it can be used either when the reference degradation-free image is available or when it is unknown. However, the metric is content sensitive and thus in a no-reference scenario it was not fully automated. In this paper, we further investigate this problem. First, we propose a method to classify images based on edge content similarity. Next, we use this method to automate the CogACR estimation of blur in a no-reference scenario. Our results indicate high accuracy of the method for a range of natural scene images distorted with the out-of-focus blur. Within the considered range of blur radius of 0 to 10 pixels, varied in steps of 0.25 pixels, the proposed method estimates the blur radius with an absolute error of up to 1 pixel in 80 to 90\% of the images.},
  articleno    = {78811D},
  author       = {Platisa, Ljiljana and Pizurica, Aleksandra and Vansteenkiste, Ewout and Philips, Wilfried},
  booktitle    = {PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING},
  editor       = {Akopian, D and Creutzburg, R and Snoek, CGM and Sebe, N and Kennedy, L},
  isbn         = {9780819484185},
  issn         = {0277-786X},
  keyword      = {image quality,wavelets,blur estimation,MODEL,EDGES,SINGULARITY DETECTION},
  language     = {eng},
  location     = {San Francisco, CA, USA},
  pages        = {12},
  publisher    = {SPIE},
  title        = {No-reference blur estimation based on the average cone ratio in the wavelet domain},
  url          = {http://dx.doi.org/10.1117/12.872836},
  volume       = {7881},
  year         = {2011},
}

Chicago
Platisa, Ljiljana, Aleksandra Pizurica, Ewout Vansteenkiste, and Wilfried Philips. 2011. “No-reference Blur Estimation Based on the Average Cone Ratio in the Wavelet Domain.” In Proceedings of Spie, the International Society for Optical Engineering, ed. D Akopian, R Creutzburg, CGM Snoek, N Sebe, and L Kennedy. Vol. 7881. Bellingham, WA, USA: SPIE.
APA
Platisa, L., Pizurica, A., Vansteenkiste, E., & Philips, W. (2011). No-reference blur estimation based on the average cone ratio in the wavelet domain. In D Akopian, R. Creutzburg, C. Snoek, N. Sebe, & L. Kennedy (Eds.), PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING (Vol. 7881). Presented at the Conference on Multimedia on Mobile Devices and Multimedia Content Access : Algorithms and Systems V, Bellingham, WA, USA: SPIE.
Vancouver
1.
Platisa L, Pizurica A, Vansteenkiste E, Philips W. No-reference blur estimation based on the average cone ratio in the wavelet domain. In: Akopian D, Creutzburg R, Snoek C, Sebe N, Kennedy L, editors. PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING. Bellingham, WA, USA: SPIE; 2011.
MLA
Platisa, Ljiljana, Aleksandra Pizurica, Ewout Vansteenkiste, et al. “No-reference Blur Estimation Based on the Average Cone Ratio in the Wavelet Domain.” Proceedings of Spie, the International Society for Optical Engineering. Ed. D Akopian et al. Vol. 7881. Bellingham, WA, USA: SPIE, 2011. Print.