Ghent University Academic Bibliography

Advanced

Comparing EMC-signatures by FSV as a quality assessment tool

Jos Knockaert UGent, Davy Pissoort and Filip Vanhee (2011) PIERS 2011 Marrakesh : proceedings. p.1099-1103
abstract
Electromagnetic interference radiated by a consumer product is measured on a sample of similar devices under test. The EMC-signature of these devices can drift. It is proposed to use the Feature Selective Validation method to compare the emission from devices with a reference device in order to have a quality assessment tool.
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
keyword
FSV, quality, EMC, validation
in
PIERS 2011 Marrakesh : proceedings
pages
1099 - 1103
publisher
Electromagnetics Academy
place of publication
Cambridge, MA, USA
conference name
29th Progress In Electromagnetics Research Symposium (PIERS 2011)
conference location
Marrakech, Morocco
conference start
2011-03-20
conference end
2011-03-23
ISSN
1559-9450
ISBN
9781934142165
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1905215
handle
http://hdl.handle.net/1854/LU-1905215
alternative location
http://piers.org/piersproceedings/piers2011MarrakeshProc.php?searchname=knockaert
date created
2011-09-21 11:09:01
date last changed
2017-01-02 09:53:29
@inproceedings{1905215,
  abstract     = {Electromagnetic interference radiated by a consumer product is measured on a sample of similar devices under test. The EMC-signature of these devices can drift. It is proposed to use the Feature Selective Validation method to compare the emission from devices with a reference device in order to have a quality assessment tool.},
  author       = {Knockaert, Jos and Pissoort, Davy and Vanhee, Filip},
  booktitle    = {PIERS 2011 Marrakesh : proceedings},
  isbn         = {9781934142165},
  issn         = {1559-9450},
  keyword      = {FSV,quality,EMC,validation},
  language     = {eng},
  location     = {Marrakech, Morocco},
  pages        = {1099--1103},
  publisher    = {Electromagnetics Academy},
  title        = {Comparing EMC-signatures by FSV as a quality assessment tool},
  url          = {http://piers.org/piersproceedings/piers2011MarrakeshProc.php?searchname=knockaert},
  year         = {2011},
}

Chicago
Knockaert, Jos, Davy Pissoort, and Filip Vanhee. 2011. “Comparing EMC-signatures by FSV as a Quality Assessment Tool.” In PIERS 2011 Marrakesh : Proceedings, 1099–1103. Cambridge, MA, USA: Electromagnetics Academy.
APA
Knockaert, J., Pissoort, D., & Vanhee, F. (2011). Comparing EMC-signatures by FSV as a quality assessment tool. PIERS 2011 Marrakesh : proceedings (pp. 1099–1103). Presented at the 29th Progress In Electromagnetics Research Symposium (PIERS 2011), Cambridge, MA, USA: Electromagnetics Academy.
Vancouver
1.
Knockaert J, Pissoort D, Vanhee F. Comparing EMC-signatures by FSV as a quality assessment tool. PIERS 2011 Marrakesh : proceedings. Cambridge, MA, USA: Electromagnetics Academy; 2011. p. 1099–103.
MLA
Knockaert, Jos, Davy Pissoort, and Filip Vanhee. “Comparing EMC-signatures by FSV as a Quality Assessment Tool.” PIERS 2011 Marrakesh : Proceedings. Cambridge, MA, USA: Electromagnetics Academy, 2011. 1099–1103. Print.