Advanced search
1 file | 556.99 KB

Comparing EMC-signatures by FSV as a quality assessment tool

Author
Organization
Abstract
Electromagnetic interference radiated by a consumer product is measured on a sample of similar devices under test. The EMC-signature of these devices can drift. It is proposed to use the Feature Selective Validation method to compare the emission from devices with a reference device in order to have a quality assessment tool.
Keywords
FSV, quality, EMC, validation

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 556.99 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Knockaert, Jos, Davy Pissoort, and Filip Vanhee. 2011. “Comparing EMC-signatures by FSV as a Quality Assessment Tool.” In PIERS 2011 Marrakesh : Proceedings, 1099–1103. Cambridge, MA, USA: Electromagnetics Academy.
APA
Knockaert, J., Pissoort, D., & Vanhee, F. (2011). Comparing EMC-signatures by FSV as a quality assessment tool. PIERS 2011 Marrakesh : proceedings (pp. 1099–1103). Presented at the 29th Progress In Electromagnetics Research Symposium (PIERS 2011), Cambridge, MA, USA: Electromagnetics Academy.
Vancouver
1.
Knockaert J, Pissoort D, Vanhee F. Comparing EMC-signatures by FSV as a quality assessment tool. PIERS 2011 Marrakesh : proceedings. Cambridge, MA, USA: Electromagnetics Academy; 2011. p. 1099–103.
MLA
Knockaert, Jos, Davy Pissoort, and Filip Vanhee. “Comparing EMC-signatures by FSV as a Quality Assessment Tool.” PIERS 2011 Marrakesh : Proceedings. Cambridge, MA, USA: Electromagnetics Academy, 2011. 1099–1103. Print.
@inproceedings{1905215,
  abstract     = {Electromagnetic interference radiated by a consumer product is measured on a sample of similar devices under test. The EMC-signature of these devices can drift. It is proposed to use the Feature Selective Validation method to compare the emission from devices with a reference device in order to have a quality assessment tool.},
  author       = {Knockaert, Jos and Pissoort, Davy and Vanhee, Filip},
  booktitle    = {PIERS 2011 Marrakesh : proceedings},
  isbn         = {9781934142165},
  issn         = {1559-9450},
  keyword      = {FSV,quality,EMC,validation},
  language     = {eng},
  location     = {Marrakech, Morocco},
  pages        = {1099--1103},
  publisher    = {Electromagnetics Academy},
  title        = {Comparing EMC-signatures by FSV as a quality assessment tool},
  url          = {http://piers.org/piersproceedings/piers2011MarrakeshProc.php?searchname=knockaert},
  year         = {2011},
}