Advanced search
1 file | 402.83 KB Add to list

Reflection phenomena in particle sizing by static and dynamic light scattering

Author
Organization
Abstract
Using a monodisperse poly(methyl methacrylate) dispersion it was shown that light reflection at the sample cuvette walls may greatly influence the results of both static (SLS) and dynamic (DLS) light scattering experiments. Considering SLS, this reflection phenomenon mostly causes an overestimation of the scattered intensity at high scattering angles, which may give rise to the emergence of an additional, artificial peak in the lower region of the particle size distribution. On the other hand, the influence of reflection on DLS experiments was shown to be particularly important in the upper region of the particle size distribution. The experimentally observed phenomena were explained from basic principles of both particle sizing methods. Finally, it was shown that the disturbing effect of reflection could be avoided by modifying either the hardware or the software of the SLS and DLS techniques.
Keywords
SIZE DISTRIBUTIONS, PHOTON-CORRELATION SPECTROSCOPY

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 402.83 KB

Citation

Please use this url to cite or link to this publication:

MLA
De Meulenaer, Bruno, Paul Van Der Meeren, Jean Vanderdeelen, et al. “Reflection Phenomena in Particle Sizing by Static and Dynamic Light Scattering.” PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION 13.2 (1996): 130–136. Print.
APA
De Meulenaer, B., Van Der Meeren, P., Vanderdeelen, J., & Baert, L. (1996). Reflection phenomena in particle sizing by static and dynamic light scattering. PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, 13(2), 130–136.
Chicago author-date
De Meulenaer, Bruno, Paul Van Der Meeren, Jean Vanderdeelen, and Leon Baert. 1996. “Reflection Phenomena in Particle Sizing by Static and Dynamic Light Scattering.” Particle & Particle Systems Characterization 13 (2): 130–136.
Chicago author-date (all authors)
De Meulenaer, Bruno, Paul Van Der Meeren, Jean Vanderdeelen, and Leon Baert. 1996. “Reflection Phenomena in Particle Sizing by Static and Dynamic Light Scattering.” Particle & Particle Systems Characterization 13 (2): 130–136.
Vancouver
1.
De Meulenaer B, Van Der Meeren P, Vanderdeelen J, Baert L. Reflection phenomena in particle sizing by static and dynamic light scattering. PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION. 1996;13(2):130–6.
IEEE
[1]
B. De Meulenaer, P. Van Der Meeren, J. Vanderdeelen, and L. Baert, “Reflection phenomena in particle sizing by static and dynamic light scattering,” PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION, vol. 13, no. 2, pp. 130–136, 1996.
@article{188800,
  abstract     = {Using a monodisperse poly(methyl methacrylate) dispersion it was shown that light reflection at the sample cuvette walls may greatly influence the results of both static (SLS) and dynamic (DLS) light scattering experiments. Considering SLS, this reflection phenomenon mostly causes an overestimation of the scattered intensity at high scattering angles, which may give rise to the emergence of an additional, artificial peak in the lower region of the particle size distribution. On the other hand, the influence of reflection on DLS experiments was shown to be particularly important in the upper region of the particle size distribution. The experimentally observed phenomena were explained from basic principles of both particle sizing methods. Finally, it was shown that the disturbing effect of reflection could be avoided by modifying either the hardware or the software of the SLS and DLS techniques.},
  author       = {De Meulenaer, Bruno and Van der Meeren, Paul and Vanderdeelen, Jean and Baert, Leon},
  issn         = {0934-0866},
  journal      = {PARTICLE & PARTICLE SYSTEMS CHARACTERIZATION},
  keywords     = {SIZE DISTRIBUTIONS,PHOTON-CORRELATION SPECTROSCOPY},
  language     = {eng},
  number       = {2},
  pages        = {130--136},
  title        = {Reflection phenomena in particle sizing by static and dynamic light scattering},
  url          = {http://dx.doi.org/10.1002/ppsc.19960130211},
  volume       = {13},
  year         = {1996},
}

Altmetric
View in Altmetric