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Direct determination of Se and As in solid certified reference materials using electrothermal vaporization inductively coupled plasma mass spectrometry

Sylvie Boonen, Frank Vanhaecke UGent, Luc Moens UGent and Richard Dams UGent (1996) SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. 51(2). p.271-278
abstract
Firstly, electrothermal vaporization inductively coupled plasma mass spectrometry (ETV-ICP-MS) has been successfully applied for the direct determination of Se in solid certified reference materials (CRMs) of both biological and environmental origin. Secondly, in order to exploit one of the most important advantages of ICP-MS (the multi-element capability), Se and As have been determined simultaneously in two CRMs (''Sea lettuce'' and ''Estuarine sediment''), the potential of ETV-ICP-MS for accurate mono-element determination of As in solid CRMs having been proven in a previous study. For both the mono-element and the multi-element determinations, several parameters (ashing and vaporization temperature, carrier gas flow rate) have been studied systematically in order to obtain optimized conditions. Both the linearity of the mass response curves and the signal profiles (signal intensity as a function of time) are examined. Absolute detection limits, based on the 3s criterion, are found to be approximately 1 pg. Using single standard addition for calibration and Sb as an internal standard, accurate results are obtained for both the mono-element determinations of Se (mean relative difference with the certified value of 6.5%) and the multi-element determinations of Se and As (mean relative difference with the certified values of, respectively, 6.6% for Se and 7.2% for As).
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (proceedingsPaper)
publication status
published
subject
keyword
certified reference material, arsenic, electrothermal vaporization inductively coupled plasma mass spectrometry, selenium, solid sampling, SAMPLE INTRODUCTION, GEOLOGICAL-MATERIALS, TUNGSTEN FURNACE, INTERFERENCES, REDUCTION, ELEMENTS
journal title
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY
Spectroc. Acta Pt. B-Atom. Spectr.
editor
RFM Herber and M Stoeppler
volume
51
issue
2
issue title
Solid sampling colloquium - 6
pages
271 - 278
conference name
6th International colloquium on Solid Sampling with Atomic Spectrometry
conference location
Amsterdam, The Netherlands
conference start
1994-10-11
conference end
1994-10-13
Web of Science type
Article
ISSN
0584-8547
DOI
10.1016/S0584-8547(99)80004-4
language
English
UGent publication?
yes
classification
A1
copyright statement
I have transferred the copyright for this publication to the publisher
id
187855
handle
http://hdl.handle.net/1854/LU-187855
date created
2004-01-14 13:41:00
date last changed
2012-11-21 14:13:09
@article{187855,
  abstract     = {Firstly, electrothermal vaporization inductively coupled plasma mass spectrometry (ETV-ICP-MS) has been successfully applied for the direct determination of Se in solid certified reference materials (CRMs) of both biological and environmental origin. Secondly, in order to exploit one of the most important advantages of ICP-MS (the multi-element capability), Se and As have been determined simultaneously in two CRMs (''Sea lettuce'' and ''Estuarine sediment''), the potential of ETV-ICP-MS for accurate mono-element determination of As in solid CRMs having been proven in a previous study. For both the mono-element and the multi-element determinations, several parameters (ashing and vaporization temperature, carrier gas flow rate) have been studied systematically in order to obtain optimized conditions. Both the linearity of the mass response curves and the signal profiles (signal intensity as a function of time) are examined. Absolute detection limits, based on the 3s criterion, are found to be approximately 1 pg. Using single standard addition for calibration and Sb as an internal standard, accurate results are obtained for both the mono-element determinations of Se (mean relative difference with the certified value of 6.5\%) and the multi-element determinations of Se and As (mean relative difference with the certified values of, respectively, 6.6\% for Se and 7.2\% for As).},
  author       = {Boonen, Sylvie and Vanhaecke, Frank and Moens, Luc and Dams, Richard},
  editor       = {Herber, RFM and Stoeppler, M},
  issn         = {0584-8547},
  journal      = {SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY},
  keyword      = {certified reference material,arsenic,electrothermal vaporization inductively coupled plasma mass spectrometry,selenium,solid sampling,SAMPLE INTRODUCTION,GEOLOGICAL-MATERIALS,TUNGSTEN FURNACE,INTERFERENCES,REDUCTION,ELEMENTS},
  language     = {eng},
  location     = {Amsterdam, The Netherlands},
  number       = {2},
  pages        = {271--278},
  title        = {Direct determination of Se and As in solid certified reference materials using electrothermal vaporization inductively coupled plasma mass spectrometry},
  url          = {http://dx.doi.org/10.1016/S0584-8547(99)80004-4},
  volume       = {51},
  year         = {1996},
}

Chicago
Boonen, Sylvie, Frank Vanhaecke, Luc Moens, and Richard Dams. 1996. “Direct Determination of Se and As in Solid Certified Reference Materials Using Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry.” Ed. RFM Herber and M Stoeppler. Spectrochimica Acta Part B-atomic Spectroscopy 51 (2): 271–278.
APA
Boonen, S., Vanhaecke, F., Moens, L., & Dams, R. (1996). Direct determination of Se and As in solid certified reference materials using electrothermal vaporization inductively coupled plasma mass spectrometry. (R. Herber & M. Stoeppler, Eds.)SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 51(2), 271–278. Presented at the 6th International colloquium on Solid Sampling with Atomic Spectrometry.
Vancouver
1.
Boonen S, Vanhaecke F, Moens L, Dams R. Direct determination of Se and As in solid certified reference materials using electrothermal vaporization inductively coupled plasma mass spectrometry. Herber R, Stoeppler M, editors. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY. 1996;51(2):271–8.
MLA
Boonen, Sylvie, Frank Vanhaecke, Luc Moens, et al. “Direct Determination of Se and As in Solid Certified Reference Materials Using Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry.” Ed. RFM Herber & M Stoeppler. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY 51.2 (1996): 271–278. Print.