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Shape sensitivities of capacitances of planar conducting surfaces using the method of moments.

Jan Ureel and Daniël De Zutter UGent (1996) IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 44(2). p.198-207
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
IEEE Trans. Microw. Theory Tech.
volume
44
issue
2
pages
198-207 pages
Web of Science type
Article
ISSN
0018-9480
language
English
UGent publication?
yes
classification
A1
id
187024
handle
http://hdl.handle.net/1854/LU-187024
date created
2004-01-14 13:41:00
date last changed
2016-12-19 15:38:26
@article{187024,
  author       = {Ureel, Jan and De Zutter, Dani{\"e}l},
  issn         = {0018-9480},
  journal      = {IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES},
  language     = {eng},
  number       = {2},
  pages        = {198--207},
  title        = {Shape sensitivities of capacitances of planar conducting surfaces using the method of moments.},
  volume       = {44},
  year         = {1996},
}

Chicago
Ureel, Jan, and Daniël De Zutter. 1996. “Shape Sensitivities of Capacitances of Planar Conducting Surfaces Using the Method of Moments.” Ieee Transactions on Microwave Theory and Techniques 44 (2): 198–207.
APA
Ureel, J., & De Zutter, D. (1996). Shape sensitivities of capacitances of planar conducting surfaces using the method of moments. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 44(2), 198–207.
Vancouver
1.
Ureel J, De Zutter D. Shape sensitivities of capacitances of planar conducting surfaces using the method of moments. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 1996;44(2):198–207.
MLA
Ureel, Jan, and Daniël De Zutter. “Shape Sensitivities of Capacitances of Planar Conducting Surfaces Using the Method of Moments.” IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 44.2 (1996): 198–207. Print.