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Shape sensitivities of capacitances of planar conducting surfaces using the method of moments.

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Chicago
Ureel, Jan, and Daniël De Zutter. 1996. “Shape Sensitivities of Capacitances of Planar Conducting Surfaces Using the Method of Moments.” Ieee Transactions on Microwave Theory and Techniques 44 (2): 198–207.
APA
Ureel, J., & De Zutter, D. (1996). Shape sensitivities of capacitances of planar conducting surfaces using the method of moments. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 44(2), 198–207.
Vancouver
1.
Ureel J, De Zutter D. Shape sensitivities of capacitances of planar conducting surfaces using the method of moments. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES. 1996;44(2):198–207.
MLA
Ureel, Jan, and Daniël De Zutter. “Shape Sensitivities of Capacitances of Planar Conducting Surfaces Using the Method of Moments.” IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES 44.2 (1996): 198–207. Print.
@article{187024,
  author       = {Ureel, Jan and De Zutter, Dani{\"e}l},
  issn         = {0018-9480},
  journal      = {IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES},
  language     = {eng},
  number       = {2},
  pages        = {198--207},
  title        = {Shape sensitivities of capacitances of planar conducting surfaces using the method of moments.},
  volume       = {44},
  year         = {1996},
}