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Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET's.

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Chicago
Van Den Bosch, Sven, and Luc Martens. 1997. “Investigation of the Frequency Dispersion Effect in the Root-model Applied to Conventional and Floating-gate MESFET’s.” Ieee Transactions on Electron Devices 44 (12): 2311–2313.
APA
Van Den Bosch, S., & Martens, L. (1997). Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET’s. IEEE TRANSACTIONS ON ELECTRON DEVICES, 44(12), 2311–2313.
Vancouver
1.
Van Den Bosch S, Martens L. Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET’s. IEEE TRANSACTIONS ON ELECTRON DEVICES. 1997;44(12):2311–3.
MLA
Van Den Bosch, Sven, and Luc Martens. “Investigation of the Frequency Dispersion Effect in the Root-model Applied to Conventional and Floating-gate MESFET’s.” IEEE TRANSACTIONS ON ELECTRON DEVICES 44.12 (1997): 2311–2313. Print.
@article{185966,
  author       = {Van Den Bosch, Sven and Martens, Luc},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {12},
  pages        = {2311--2313},
  title        = {Investigation of the frequency dispersion effect in the root-model applied to conventional and floating-gate MESFET's.},
  volume       = {44},
  year         = {1997},
}