Advanced search
1 file | 128.72 KB

X-ray photoelectron spectroscopic and atomic force microscopic studies of pyrolytically coated graphite and highly oriented pyrolytic graphite used for electrothermal vaporization

Author
Organization
Abstract
The interaction between solid or liquid samples on the one hand and pyrolytically coated graphite or highly oriented pyrolytic graphite (HOPG) sample holders on the other hand during electrothermal vaporization was studied, For the characterisation of the micrometer scale topographical changes occurring on these graphite surfaces as a result of solid sample evaporation, atomic force microscopy (AFM) was used. The migration of Cd(NO3)(2) and Na2HAsO4 deposited as solutions on the surface of the HOPG was studied by depth resolved X-ray photoelectron spectroscopy(XPS) using argon ion sputter etching, It was found that the investigated compounds migrate into the graphite to a depth of at least 1-1.5 mu m. XPS data suggest that the migration involves either the hydrated metal ions or the molecules.
Keywords
depth profiling, atomic force microscopy, electrothermal vaporization, highly oriented pyrolytic graphite, pyrolytically coated graphite, solid sample, X-ray photoelectron spectroscopy, SCANNING TUNNELING MICROSCOPE, PLASMA-MASS SPECTROMETRY, GLASSY-CARBON TUBES, ABSORPTION SPECTROMETRY, SURFACES, ATOMIZATION, PLATFORMS, CADMIUM

Downloads

  • (...).pdf
    • full text
    • |
    • UGent only
    • |
    • PDF
    • |
    • 128.72 KB

Citation

Please use this url to cite or link to this publication:

Chicago
Galbács, Gábor, János Sneider, Albert Oszkó, Frank Vanhaecke, and Luc Moens. 1997. “X-ray Photoelectron Spectroscopic and Atomic Force Microscopic Studies of Pyrolytically Coated Graphite and Highly Oriented Pyrolytic Graphite Used for Electrothermal Vaporization.” Journal of Analytical Atomic Spectrometry 12 (9): 951–955.
APA
Galbács, G., Sneider, J., Oszkó, A., Vanhaecke, F., & Moens, L. (1997). X-ray photoelectron spectroscopic and atomic force microscopic studies of pyrolytically coated graphite and highly oriented pyrolytic graphite used for electrothermal vaporization. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 12(9), 951–955. Presented at the 1997 European winter conference on Plasma Spectrochemistry.
Vancouver
1.
Galbács G, Sneider J, Oszkó A, Vanhaecke F, Moens L. X-ray photoelectron spectroscopic and atomic force microscopic studies of pyrolytically coated graphite and highly oriented pyrolytic graphite used for electrothermal vaporization. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 1997;12(9):951–5.
MLA
Galbács, Gábor, János Sneider, Albert Oszkó, et al. “X-ray Photoelectron Spectroscopic and Atomic Force Microscopic Studies of Pyrolytically Coated Graphite and Highly Oriented Pyrolytic Graphite Used for Electrothermal Vaporization.” JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 12.9 (1997): 951–955. Print.
@article{185028,
  abstract     = {The interaction between solid or liquid samples on the one hand and pyrolytically coated graphite or highly oriented pyrolytic graphite (HOPG) sample holders on the other hand during electrothermal vaporization was studied, For the characterisation of the micrometer scale topographical changes occurring on these graphite surfaces as a result of solid sample evaporation, atomic force microscopy (AFM) was used. The migration of Cd(NO3)(2) and Na2HAsO4 deposited as solutions on the surface of the HOPG was studied by depth resolved X-ray photoelectron spectroscopy(XPS) using argon ion sputter etching, It was found that the investigated compounds migrate into the graphite to a depth of at least 1-1.5 mu m. XPS data suggest that the migration involves either the hydrated metal ions or the molecules.},
  author       = {Galb{\'a}cs, G{\'a}bor and Sneider, J{\'a}nos and Oszk{\'o}, Albert and Vanhaecke, Frank and Moens, Luc},
  issn         = {0267-9477},
  journal      = {JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY},
  keyword      = {depth profiling,atomic force microscopy,electrothermal vaporization,highly oriented pyrolytic graphite,pyrolytically coated graphite,solid sample,X-ray photoelectron spectroscopy,SCANNING TUNNELING MICROSCOPE,PLASMA-MASS SPECTROMETRY,GLASSY-CARBON TUBES,ABSORPTION SPECTROMETRY,SURFACES,ATOMIZATION,PLATFORMS,CADMIUM},
  language     = {eng},
  location     = {Ghent, Belgium},
  number       = {9},
  pages        = {951--955},
  title        = {X-ray photoelectron spectroscopic and atomic force microscopic studies of pyrolytically coated graphite and highly oriented pyrolytic graphite used for electrothermal vaporization},
  url          = {http://dx.doi.org/10.1039/a701979c},
  volume       = {12},
  year         = {1997},
}

Altmetric
View in Altmetric