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A Robust F-measure for evaluating discovered process models

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Chicago
De Weerdt, Jochen, Manu De Backer, Jan Vanthienen, and Bart Baesens. 2011. “A Robust F-measure for Evaluating Discovered Process Models.” In IEEE Symposium Series on Computational Intelligence, 148–155. New York, NY, USA: IEEE.
APA
De Weerdt, J., De Backer, M., Vanthienen, J., & Baesens, B. (2011). A Robust F-measure for evaluating discovered process models. IEEE Symposium series on computational intelligence (pp. 148–155). Presented at the IEEE Symposium on Computational Intelligence and Data Mining (CIDM - 2011), New York, NY, USA: IEEE.
Vancouver
1.
De Weerdt J, De Backer M, Vanthienen J, Baesens B. A Robust F-measure for evaluating discovered process models. IEEE Symposium series on computational intelligence. New York, NY, USA: IEEE; 2011. p. 148–55.
MLA
De Weerdt, Jochen, Manu De Backer, Jan Vanthienen, et al. “A Robust F-measure for Evaluating Discovered Process Models.” IEEE Symposium Series on Computational Intelligence. New York, NY, USA: IEEE, 2011. 148–155. Print.
@inproceedings{1842796,
  author       = {De Weerdt, Jochen and De Backer, Manu and Vanthienen, Jan and Baesens, Bart},
  booktitle    = {IEEE Symposium series on computational intelligence},
  isbn         = {9781424499250},
  language     = {eng},
  location     = {Paris, France},
  pages        = {148--155},
  publisher    = {IEEE},
  title        = {A Robust F-measure for evaluating discovered process models},
  year         = {2011},
}