Ghent University Academic Bibliography

Advanced

A Robust F-measure for evaluating discovered process models

Jochen De Weerdt, Manu De Backer UGent, Jan Vanthienen and Bart Baesens (2011) IEEE Symposium series on computational intelligence. p.148-155
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
IEEE Symposium series on computational intelligence
pages
148 - 155
publisher
IEEE
place of publication
New York, NY, USA
conference name
IEEE Symposium on Computational Intelligence and Data Mining (CIDM - 2011)
conference location
Paris, France
conference start
2011-04-11
conference end
2011-04-15
ISBN
9781424499250
language
English
UGent publication?
yes
classification
C1
copyright statement
I have transferred the copyright for this publication to the publisher
id
1842796
handle
http://hdl.handle.net/1854/LU-1842796
date created
2011-06-27 17:13:34
date last changed
2015-06-17 09:48:07
@inproceedings{1842796,
  author       = {De Weerdt, Jochen and De Backer, Manu and Vanthienen, Jan and Baesens, Bart},
  booktitle    = {IEEE Symposium series on computational intelligence},
  isbn         = {9781424499250},
  language     = {eng},
  location     = {Paris, France},
  pages        = {148--155},
  publisher    = {IEEE},
  title        = {A Robust F-measure for evaluating discovered process models},
  year         = {2011},
}

Chicago
De Weerdt, Jochen, Manu De Backer, Jan Vanthienen, and Bart Baesens. 2011. “A Robust F-measure for Evaluating Discovered Process Models.” In IEEE Symposium Series on Computational Intelligence, 148–155. New York, NY, USA: IEEE.
APA
De Weerdt, J., De Backer, M., Vanthienen, J., & Baesens, B. (2011). A Robust F-measure for evaluating discovered process models. IEEE Symposium series on computational intelligence (pp. 148–155). Presented at the IEEE Symposium on Computational Intelligence and Data Mining (CIDM - 2011), New York, NY, USA: IEEE.
Vancouver
1.
De Weerdt J, De Backer M, Vanthienen J, Baesens B. A Robust F-measure for evaluating discovered process models. IEEE Symposium series on computational intelligence. New York, NY, USA: IEEE; 2011. p. 148–55.
MLA
De Weerdt, Jochen, Manu De Backer, Jan Vanthienen, et al. “A Robust F-measure for Evaluating Discovered Process Models.” IEEE Symposium Series on Computational Intelligence. New York, NY, USA: IEEE, 2011. 148–155. Print.