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Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire.

(1998) APPLIED PHYSICS LETTERS. 73(22). p.3273-3275
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MLA
O’DONNELL, KP, PG MIDDLETON, C TRAGER-COWAN, et al. “Energy-dispersive X-ray Imaging of an InGaN/GaN Bilayer on Sapphire.” APPLIED PHYSICS LETTERS 73.22 (1998): 3273–3275. Print.
APA
O’DONNELL, K., MIDDLETON, P., TRAGER-COWAN, C., YOUNG, C., BAYLISS, S., FLETCHER, I., VAN DER STRICHT, W., et al. (1998). Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire. APPLIED PHYSICS LETTERS, 73(22), 3273–3275.
Chicago author-date
O’DONNELL, KP, PG MIDDLETON, C TRAGER-COWAN, C YOUNG, SC BAYLISS, I FLETCHER, W VAN DER STRICHT, Ingrid Moerman, and Piet Demeester. 1998. “Energy-dispersive X-ray Imaging of an InGaN/GaN Bilayer on Sapphire.” Applied Physics Letters 73 (22): 3273–3275.
Chicago author-date (all authors)
O’DONNELL, KP, PG MIDDLETON, C TRAGER-COWAN, C YOUNG, SC BAYLISS, I FLETCHER, W VAN DER STRICHT, Ingrid Moerman, and Piet Demeester. 1998. “Energy-dispersive X-ray Imaging of an InGaN/GaN Bilayer on Sapphire.” Applied Physics Letters 73 (22): 3273–3275.
Vancouver
1.
O’DONNELL K, MIDDLETON P, TRAGER-COWAN C, YOUNG C, BAYLISS S, FLETCHER I, et al. Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire. APPLIED PHYSICS LETTERS. 1998;73(22):3273–5.
IEEE
[1]
K. O’DONNELL et al., “Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire.,” APPLIED PHYSICS LETTERS, vol. 73, no. 22, pp. 3273–3275, 1998.
@article{180868,
  author       = {O'DONNELL, KP and MIDDLETON, PG and TRAGER-COWAN, C and YOUNG, C and BAYLISS, SC and FLETCHER, I and VAN DER STRICHT, W and Moerman, Ingrid and Demeester, Piet},
  issn         = {0003-6951},
  journal      = {APPLIED PHYSICS LETTERS},
  language     = {eng},
  number       = {22},
  pages        = {3273--3275},
  title        = {Energy-dispersive x-ray imaging of an InGaN/GaN bilayer on sapphire.},
  volume       = {73},
  year         = {1998},
}

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