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Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment.

(1998) JOURNAL OF APPLIED PHYSICS. 84(6). p.3226-3231
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Chicago
Detavernier, Christophe, Roland Vanmeirhaeghe, R DONATON, K MAEX, and Felix Cardon. 1998. “Ballistic Electron Emission Microscopy Study of Barrier Height Inhomogeneities Introduced in Au/n-Si Schottky Contacts by a HF Pretreatment.” Journal of Applied Physics 84 (6): 3226–3231.
APA
Detavernier, C., Vanmeirhaeghe, R., DONATON, R., MAEX, K., & Cardon, F. (1998). Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment. JOURNAL OF APPLIED PHYSICS, 84(6), 3226–3231.
Vancouver
1.
Detavernier C, Vanmeirhaeghe R, DONATON R, MAEX K, Cardon F. Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment. JOURNAL OF APPLIED PHYSICS. 1998;84(6):3226–31.
MLA
Detavernier, Christophe, Roland Vanmeirhaeghe, R DONATON, et al. “Ballistic Electron Emission Microscopy Study of Barrier Height Inhomogeneities Introduced in Au/n-Si Schottky Contacts by a HF Pretreatment.” JOURNAL OF APPLIED PHYSICS 84.6 (1998): 3226–3231. Print.
@article{179887,
  author       = {Detavernier, Christophe and Vanmeirhaeghe, Roland and DONATON, R and MAEX, K and Cardon, Felix},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {6},
  pages        = {3226--3231},
  title        = {Ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/n-Si Schottky contacts by a HF pretreatment.},
  volume       = {84},
  year         = {1998},
}

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