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Ortho-positronium formation in anodic layers on aluminium studied by slow positrons

(1997) Materials Science Forum. 255(2). p.724-726
Author
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Abstract
With a Variable Energy Positron beam annihilation energy spectra are measured in eight different porous anodic layers on aluminium. Analysing the Doppler broadening of the annihilation line information can be achieved concerning layer characteristics like thickness. The presence of orthopositronium in the poses can be determined by comparing the peak to Compton ratios of the inner aluminium substrate and the porous layers.
Keywords
positronium, anodic layers, slow positron beam, AL2O3 FILMS, AL METAL, KINETICS, GROWTH

Citation

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Chicago
Van Hoecke, Toon, Danny Segers, H Schut, Charles Dauwe, A Van Veen, B Van Waeyenberge, and L Palffy. 1997. “Ortho-positronium Formation in Anodic Layers on Aluminium Studied by Slow Positrons.” Ed. YC Jean, M Eldrup, DM Schrader, and RN West. Materials Science Forum 255 (2): 724–726.
APA
Van Hoecke, T., Segers, D., Schut, H., Dauwe, C., Van Veen, A., Van Waeyenberge, B., & Palffy, L. (1997). Ortho-positronium formation in anodic layers on aluminium studied by slow positrons. (Y. Jean, M. Eldrup, D. Schrader, & R. West, Eds.)Materials Science Forum, 255(2), 724–726. Presented at the 11th International conference on Positron Annihilation (ICPA-11).
Vancouver
1.
Van Hoecke T, Segers D, Schut H, Dauwe C, Van Veen A, Van Waeyenberge B, et al. Ortho-positronium formation in anodic layers on aluminium studied by slow positrons. Jean Y, Eldrup M, Schrader D, West R, editors. Materials Science Forum. Stafa-Zürich, Switzerland: Trans Tech; 1997;255(2):724–6.
MLA
Van Hoecke, Toon, Danny Segers, H Schut, et al. “Ortho-positronium Formation in Anodic Layers on Aluminium Studied by Slow Positrons.” Ed. YC Jean et al. Materials Science Forum 255.2 (1997): 724–726. Print.
@article{176564,
  abstract     = {With a Variable Energy Positron beam annihilation energy spectra are measured in eight different porous anodic layers on aluminium. Analysing the Doppler broadening of the annihilation line information can be achieved concerning layer characteristics like thickness. The presence of orthopositronium in the poses can be determined by comparing the peak to Compton ratios of the inner aluminium substrate and the porous layers.},
  author       = {Van Hoecke, Toon and Segers, Danny and Schut, H and Dauwe, Charles and Van Veen, A and Van Waeyenberge, B and Palffy, L},
  editor       = {Jean, YC and Eldrup, M and Schrader, DM and West, RN},
  isbn         = {9780878497799},
  issn         = {0255-5476},
  journal      = {Materials Science Forum},
  language     = {eng},
  location     = {Kansas City, MO, USA},
  number       = {2},
  pages        = {724--726},
  publisher    = {Trans Tech},
  title        = {Ortho-positronium formation in anodic layers on aluminium studied by slow positrons},
  url          = {http://dx.doi.org/10.4028/www.scientific.net/MSF.255-257.724},
  volume       = {255},
  year         = {1997},
}

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