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Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations.

Dirk Poelman UGent, Davy Wauters, Jorg Versluys and Roland Vanmeirhaeghe (2001) JOURNAL OF APPLIED PHYSICS. 90(1). p.248-251
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
JOURNAL OF APPLIED PHYSICS
J. Appl. Phys.
volume
90
issue
1
pages
248-251 pages
Web of Science type
Article
Web of Science id
000169361100037
JCR category
PHYSICS, APPLIED
JCR impact factor
2.128 (2001)
JCR rank
4/70 (2001)
JCR quartile
1 (2001)
ISSN
0021-8979
language
English
UGent publication?
yes
classification
A1
id
169027
handle
http://hdl.handle.net/1854/LU-169027
date created
2004-01-14 13:40:00
date last changed
2016-12-19 15:37:57
@article{169027,
  author       = {Poelman, Dirk and Wauters, Davy and Versluys, Jorg and Vanmeirhaeghe, Roland},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {1},
  pages        = {248--251},
  title        = {Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations.},
  volume       = {90},
  year         = {2001},
}

Chicago
Poelman, Dirk, Davy Wauters, Jorg Versluys, and Roland Vanmeirhaeghe. 2001. “Microoptical Characterization of Electroluminescent SrS: Cu,Ag Thin Films by Photo- and Cathodoluminescence Observations.” Journal of Applied Physics 90 (1): 248–251.
APA
Poelman, D., Wauters, D., Versluys, J., & Vanmeirhaeghe, R. (2001). Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations. JOURNAL OF APPLIED PHYSICS, 90(1), 248–251.
Vancouver
1.
Poelman D, Wauters D, Versluys J, Vanmeirhaeghe R. Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations. JOURNAL OF APPLIED PHYSICS. 2001;90(1):248–51.
MLA
Poelman, Dirk, Davy Wauters, Jorg Versluys, et al. “Microoptical Characterization of Electroluminescent SrS: Cu,Ag Thin Films by Photo- and Cathodoluminescence Observations.” JOURNAL OF APPLIED PHYSICS 90.1 (2001): 248–251. Print.