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Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations.

(2001) JOURNAL OF APPLIED PHYSICS. 90(1). p.248-251
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Chicago
Poelman, Dirk, Davy Wauters, Jorg Versluys, and Roland Vanmeirhaeghe. 2001. “Microoptical Characterization of Electroluminescent SrS: Cu,Ag Thin Films by Photo- and Cathodoluminescence Observations.” Journal of Applied Physics 90 (1): 248–251.
APA
Poelman, D., Wauters, D., Versluys, J., & Vanmeirhaeghe, R. (2001). Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations. JOURNAL OF APPLIED PHYSICS, 90(1), 248–251.
Vancouver
1.
Poelman D, Wauters D, Versluys J, Vanmeirhaeghe R. Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations. JOURNAL OF APPLIED PHYSICS. 2001;90(1):248–51.
MLA
Poelman, Dirk, Davy Wauters, Jorg Versluys, et al. “Microoptical Characterization of Electroluminescent SrS: Cu,Ag Thin Films by Photo- and Cathodoluminescence Observations.” JOURNAL OF APPLIED PHYSICS 90.1 (2001): 248–251. Print.
@article{169027,
  author       = {Poelman, Dirk and Wauters, Davy and Versluys, Jorg and Vanmeirhaeghe, Roland},
  issn         = {0021-8979},
  journal      = {JOURNAL OF APPLIED PHYSICS},
  language     = {eng},
  number       = {1},
  pages        = {248--251},
  title        = {Microoptical characterization of electroluminescent SrS: Cu,Ag thin films by photo- and cathodoluminescence observations.},
  volume       = {90},
  year         = {2001},
}

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