Academic Bibliography

 Search 200 years of publications by Ghent University researchers.
Advanced search
Add to list
  1. Search results
  2. Spectroscopic examination of two Egyp...

Spectroscopic examination of two Egyptian masks : a combined method approach

Peter Vandenabeele (UGent) , A von Bohlen, Luc Moens (UGent) , R Klockenkämper, F Joukes and G Dewispelaere
(2000) ANALYTICAL LETTERS. 33(15). p.3315-3332
Author
Organization
Abstract
The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.
Keywords
total-reflection X-ray fluorescence analysis (TXRF), art analysis, Micro-Raman spectroscopy (MRS), pigment analysis, combined method approach, micro sampling methods, Egyptian masks, pararealgar, orpiment, realgar, vermilion, iron oxide, X-RAY-FLUORESCENCE, MICRO-RAMAN SPECTROSCOPY, MEDIEVAL MANUSCRIPTS, PIGMENTS, MICROANALYSIS, PARAREALGAR, TXRF, ART

Citation

Please use this url to cite or link to this publication:

MLA
Vandenabeele, Peter, et al. “Spectroscopic Examination of Two Egyptian Masks : A Combined Method Approach.” ANALYTICAL LETTERS, vol. 33, no. 15, 2000, pp. 3315–32, doi:10.1080/00032719.2000.10399503.
APA
Vandenabeele, P., von Bohlen, A., Moens, L., Klockenkämper, R., Joukes, F., & Dewispelaere, G. (2000). Spectroscopic examination of two Egyptian masks : a combined method approach. ANALYTICAL LETTERS, 33(15), 3315–3332. https://doi.org/10.1080/00032719.2000.10399503
Chicago author-date
Vandenabeele, Peter, A von Bohlen, Luc Moens, R Klockenkämper, F Joukes, and G Dewispelaere. 2000. “Spectroscopic Examination of Two Egyptian Masks : A Combined Method Approach.” ANALYTICAL LETTERS 33 (15): 3315–32. https://doi.org/10.1080/00032719.2000.10399503.
Chicago author-date (all authors)
Vandenabeele, Peter, A von Bohlen, Luc Moens, R Klockenkämper, F Joukes, and G Dewispelaere. 2000. “Spectroscopic Examination of Two Egyptian Masks : A Combined Method Approach.” ANALYTICAL LETTERS 33 (15): 3315–3332. doi:10.1080/00032719.2000.10399503.
Vancouver
1.
Vandenabeele P, von Bohlen A, Moens L, Klockenkämper R, Joukes F, Dewispelaere G. Spectroscopic examination of two Egyptian masks : a combined method approach. ANALYTICAL LETTERS. 2000;33(15):3315–32.
IEEE
[1]
P. Vandenabeele, A. von Bohlen, L. Moens, R. Klockenkämper, F. Joukes, and G. Dewispelaere, “Spectroscopic examination of two Egyptian masks : a combined method approach,” ANALYTICAL LETTERS, vol. 33, no. 15, pp. 3315–3332, 2000.
@article{167478,
  abstract     = {{The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. 
In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.}},
  author       = {{Vandenabeele, Peter and von Bohlen, A and Moens, Luc and Klockenkämper, R and Joukes, F and Dewispelaere, G}},
  issn         = {{0003-2719}},
  journal      = {{ANALYTICAL LETTERS}},
  keywords     = {{total-reflection X-ray fluorescence analysis (TXRF),art analysis,Micro-Raman spectroscopy (MRS),pigment analysis,combined method approach,micro sampling methods,Egyptian masks,pararealgar,orpiment,realgar,vermilion,iron oxide,X-RAY-FLUORESCENCE,MICRO-RAMAN SPECTROSCOPY,MEDIEVAL MANUSCRIPTS,PIGMENTS,MICROANALYSIS,PARAREALGAR,TXRF,ART}},
  language     = {{eng}},
  number       = {{15}},
  pages        = {{3315--3332}},
  title        = {{Spectroscopic examination of two Egyptian masks : a combined method approach}},
  url          = {{http://doi.org/10.1080/00032719.2000.10399503}},
  volume       = {{33}},
  year         = {{2000}},
}
Altmetric
View in Altmetric
Web of Science
Times cited: