Ghent University Academic Bibliography

Advanced

Spectroscopic examination of two Egyptian masks: a combined method approach

Peter Vandenabeele UGent, A von Bohlen, Luc Moens UGent, R Klockenkämper, F Joukes and G Dewispelaere (2000) ANALYTICAL LETTERS. 33(15). p.3315-3332
abstract
The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
total-reflection X-ray fluorescence analysis (TXRF), art analysis, Micro-Raman spectroscopy (MRS), pigment analysis, combined method approach, micro sampling methods, Egyptian masks, pararealgar, orpiment, realgar, vermilion, iron oxide, X-RAY-FLUORESCENCE, MICRO-RAMAN SPECTROSCOPY, MEDIEVAL MANUSCRIPTS, PIGMENTS, MICROANALYSIS, PARAREALGAR, TXRF, ART
journal title
ANALYTICAL LETTERS
Anal. Lett.
volume
33
issue
15
pages
3315 - 3332
Web of Science type
Article
Web of Science id
000165997200015
ISSN
0003-2719
DOI
10.1080/00032719.2000.10399503
language
English
UGent publication?
yes
classification
A1
id
167478
handle
http://hdl.handle.net/1854/LU-167478
date created
2004-01-14 13:40:00
date last changed
2012-11-14 14:48:01
@article{167478,
  abstract     = {The identification of the materials used in painted works of art is of great importance for (art-) historians, conservators and keepers. Total-reflection X-Ray Fluorescence analysis (TXRF) as well as Micro-Raman Spectroscopy (MLRS) have been shown to be successful in the identification of the pigments in artefacts, such as mediaeval manuscripts, polychrome sculptures as well as panel-, easel- and wall-painting. 
In this work the advantages of a combined method approach are demonstrated and as a case study, the examination of two classical. Egyptian masks is presented. A gentle micro sampling method, which does not leave any visible trace on the artefacts was used and both of the analytical methods, TXRF and MRS, are performed on the same samples, giving complementary information.},
  author       = {Vandenabeele, Peter and von Bohlen, A and Moens, Luc and Klockenk{\"a}mper, R and Joukes, F and Dewispelaere, G},
  issn         = {0003-2719},
  journal      = {ANALYTICAL LETTERS},
  keyword      = {total-reflection X-ray fluorescence analysis (TXRF),art analysis,Micro-Raman spectroscopy (MRS),pigment analysis,combined method approach,micro sampling methods,Egyptian masks,pararealgar,orpiment,realgar,vermilion,iron oxide,X-RAY-FLUORESCENCE,MICRO-RAMAN SPECTROSCOPY,MEDIEVAL MANUSCRIPTS,PIGMENTS,MICROANALYSIS,PARAREALGAR,TXRF,ART},
  language     = {eng},
  number       = {15},
  pages        = {3315--3332},
  title        = {Spectroscopic examination of two Egyptian masks: a combined method approach},
  url          = {http://dx.doi.org/10.1080/00032719.2000.10399503},
  volume       = {33},
  year         = {2000},
}

Chicago
Vandenabeele, Peter, A von Bohlen, Luc Moens, R Klockenkämper, F Joukes, and G Dewispelaere. 2000. “Spectroscopic Examination of Two Egyptian Masks: a Combined Method Approach.” Analytical Letters 33 (15): 3315–3332.
APA
Vandenabeele, P., von Bohlen, A., Moens, L., Klockenkämper, R., Joukes, F., & Dewispelaere, G. (2000). Spectroscopic examination of two Egyptian masks: a combined method approach. ANALYTICAL LETTERS, 33(15), 3315–3332.
Vancouver
1.
Vandenabeele P, von Bohlen A, Moens L, Klockenkämper R, Joukes F, Dewispelaere G. Spectroscopic examination of two Egyptian masks: a combined method approach. ANALYTICAL LETTERS. 2000;33(15):3315–32.
MLA
Vandenabeele, Peter, A von Bohlen, Luc Moens, et al. “Spectroscopic Examination of Two Egyptian Masks: a Combined Method Approach.” ANALYTICAL LETTERS 33.15 (2000): 3315–3332. Print.