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Characterization of pigments in Mercatellis manuscripts by total-reflection X-ray fluorescence and Raman-microscopy

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MLA
Vandenabeele, Peter, et al. “Characterization of Pigments in Mercatellis Manuscripts by Total-Reflection X-Ray Fluorescence and Raman-Microscopy.” Archaeometry ’98 : Proceedings of the 31st International Symposium on Archaeometry, Budapest, 26 April-3 May 1998, edited by Erzsébet Jerem et al., Archaeopress, 2002, pp. 825–27.
APA
Vandenabeele, P., Wehling, B., Moens, L., De Reu, M., Van Hooydonk, G., von Bohlen, A., & Klockenkämper, R. (2002). Characterization of pigments in Mercatellis manuscripts by total-reflection X-ray fluorescence and Raman-microscopy. In E. Jerem, K. T. Biró, & E. Rudner (Eds.), Archaeometry ’98 : proceedings of the 31st international symposium on archaeometry, Budapest, 26 April-3 May 1998 (pp. 825–827). Oxford, UK: Archaeopress.
Chicago author-date
Vandenabeele, Peter, B Wehling, Luc Moens, Martine De Reu, Guido Van Hooydonk, Alex von Bohlen, and Reinhold Klockenkämper. 2002. “Characterization of Pigments in Mercatellis Manuscripts by Total-Reflection X-Ray Fluorescence and Raman-Microscopy.” In Archaeometry ’98 : Proceedings of the 31st International Symposium on Archaeometry, Budapest, 26 April-3 May 1998, edited by Erzsébet Jerem, Katalin T Biró, and Edina Rudner, 825–27. Oxford, UK: Archaeopress.
Chicago author-date (all authors)
Vandenabeele, Peter, B Wehling, Luc Moens, Martine De Reu, Guido Van Hooydonk, Alex von Bohlen, and Reinhold Klockenkämper. 2002. “Characterization of Pigments in Mercatellis Manuscripts by Total-Reflection X-Ray Fluorescence and Raman-Microscopy.” In Archaeometry ’98 : Proceedings of the 31st International Symposium on Archaeometry, Budapest, 26 April-3 May 1998, ed by. Erzsébet Jerem, Katalin T Biró, and Edina Rudner, 825–827. Oxford, UK: Archaeopress.
Vancouver
1.
Vandenabeele P, Wehling B, Moens L, De Reu M, Van Hooydonk G, von Bohlen A, et al. Characterization of pigments in Mercatellis manuscripts by total-reflection X-ray fluorescence and Raman-microscopy. In: Jerem E, Biró KT, Rudner E, editors. Archaeometry ’98 : proceedings of the 31st international symposium on archaeometry, Budapest, 26 April-3 May 1998. Oxford, UK: Archaeopress; 2002. p. 825–7.
IEEE
[1]
P. Vandenabeele et al., “Characterization of pigments in Mercatellis manuscripts by total-reflection X-ray fluorescence and Raman-microscopy,” in Archaeometry ’98 : proceedings of the 31st international symposium on archaeometry, Budapest, 26 April-3 May 1998, Budapest, Hungary, 2002, pp. 825–827.
@inproceedings{162689,
  author       = {Vandenabeele, Peter and Wehling, B and Moens, Luc and De Reu, Martine and Van Hooydonk, Guido and von Bohlen, Alex and Klockenkämper, Reinhold},
  booktitle    = {Archaeometry '98 : proceedings of the 31st international symposium on archaeometry, Budapest, 26 April-3 May 1998},
  editor       = {Jerem, Erzsébet and Biró, Katalin T and Rudner, Edina},
  isbn         = {9781841714219},
  language     = {eng},
  location     = {Budapest, Hungary},
  pages        = {825--827},
  publisher    = {Archaeopress},
  title        = {Characterization of pigments in Mercatellis manuscripts by total-reflection X-ray fluorescence and Raman-microscopy},
  year         = {2002},
}