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Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates.

(2002) ATMOSPHERIC ENVIRONMENT (1994). 36(5). p.899-909
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Chicago
VAN HAM, R, Mieke Adriaens, P PRATI, A ZUCCHIATTI, L VAN VAECK, and F ADAMS. 2002. “Static Secondary Ion Mass Spectrometry as a New Analytical Tool for Measuring Atmospheric Particles on Insulating Substrates.” ATMOSPHERIC ENVIRONMENT (1994) 36 (5): 899–909.
APA
VAN HAM, R., Adriaens, M., PRATI, P., ZUCCHIATTI, A., VAN VAECK, L., & ADAMS, F. (2002). Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates. ATMOSPHERIC ENVIRONMENT (1994), 36(5), 899–909.
Vancouver
1.
VAN HAM R, Adriaens M, PRATI P, ZUCCHIATTI A, VAN VAECK L, ADAMS F. Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates. ATMOSPHERIC ENVIRONMENT (1994). 2002;36(5):899–909.
MLA
VAN HAM, R, Mieke Adriaens, P PRATI, et al. “Static Secondary Ion Mass Spectrometry as a New Analytical Tool for Measuring Atmospheric Particles on Insulating Substrates.” ATMOSPHERIC ENVIRONMENT (1994) 36.5 (2002): 899–909. Print.
@article{162672,
  author       = {VAN HAM, R and Adriaens, Mieke and PRATI, P and ZUCCHIATTI, A and VAN VAECK, L and ADAMS, F},
  issn         = {1352-2310},
  journal      = {ATMOSPHERIC ENVIRONMENT (1994)},
  language     = {eng},
  number       = {5},
  pages        = {899--909},
  title        = {Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates.},
  volume       = {36},
  year         = {2002},
}

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