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Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates.

R VAN HAM, Mieke Adriaens UGent, P PRATI, A ZUCCHIATTI, L VAN VAECK and F ADAMS (2002) ATMOSPHERIC ENVIRONMENT (1994). 36(5). p.899-909
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
ATMOSPHERIC ENVIRONMENT (1994)
Atmos. Environ. (1994)
volume
36
issue
5
pages
899-909 pages
Web of Science type
Article
Web of Science id
000174064000013
JCR category
ENVIRONMENTAL SCIENCES
JCR impact factor
2.352 (2002)
JCR rank
10/130 (2002)
JCR quartile
1 (2002)
ISSN
1352-2310
language
English
UGent publication?
yes
classification
A1
id
162672
handle
http://hdl.handle.net/1854/LU-162672
date created
2004-01-14 13:39:00
date last changed
2018-01-29 12:18:30
@article{162672,
  author       = {VAN HAM, R and Adriaens, Mieke and PRATI, P and ZUCCHIATTI, A and VAN VAECK, L and ADAMS, F},
  issn         = {1352-2310},
  journal      = {ATMOSPHERIC ENVIRONMENT (1994)},
  language     = {eng},
  number       = {5},
  pages        = {899--909},
  title        = {Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates.},
  volume       = {36},
  year         = {2002},
}

Chicago
VAN HAM, R, Mieke Adriaens, P PRATI, A ZUCCHIATTI, L VAN VAECK, and F ADAMS. 2002. “Static Secondary Ion Mass Spectrometry as a New Analytical Tool for Measuring Atmospheric Particles on Insulating Substrates.” ATMOSPHERIC ENVIRONMENT (1994) 36 (5): 899–909.
APA
VAN HAM, R., Adriaens, M., PRATI, P., ZUCCHIATTI, A., VAN VAECK, L., & ADAMS, F. (2002). Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates. ATMOSPHERIC ENVIRONMENT (1994), 36(5), 899–909.
Vancouver
1.
VAN HAM R, Adriaens M, PRATI P, ZUCCHIATTI A, VAN VAECK L, ADAMS F. Static secondary ion mass spectrometry as a new analytical tool for measuring atmospheric particles on insulating substrates. ATMOSPHERIC ENVIRONMENT (1994). 2002;36(5):899–909.
MLA
VAN HAM, R, Mieke Adriaens, P PRATI, et al. “Static Secondary Ion Mass Spectrometry as a New Analytical Tool for Measuring Atmospheric Particles on Insulating Substrates.” ATMOSPHERIC ENVIRONMENT (1994) 36.5 (2002): 899–909. Print.