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Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Martin Resano Ezcaray, Marieke Verstraete, Frank Vanhaecke UGent and Luc Moens UGent (2002) JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 17(8). p.897-903
abstract
In this work, a method has been developed for the fast and reliable determination of silicon in polyamides (two samples with silicon contents of 10 and 50 mug g(-1) were analyzed) by means of solid sampling electrothermal vaporization ICP-MS. For all silicon isotopes, the occurrence of spectral interferences was studied as a function of the vaporization temperature. The benefits of the use of palladium as a chemical modifier were investigated. Finally, a vaporization temperature of 2400 degreesC, monitoring of Si-29(+) and the addition of 1 mug of palladium were found to be the optimum conditions for the determination. The method finally proposed shows very interesting features for this particular element: the ability to use aqueous standard solutions for calibration, a low sample consumption (a few milligrams only), a high sample throughput (20 min analysis time per sample), a low limit of detection (0.3 mug g(-1)) and a reduced risk of analyte losses and, particularly, of contamination. Additionally, the approach also exhibits multi-element capabilities.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
BIOLOGICAL-MATERIALS, ICP-MS, PROCESS CHEMICALS, BORON-NITRIDE, IMPURITIES, PALLADIUM, ZIRCONIUM, GRAPHITE-FURNACE, EMISSION-SPECTROMETRY, ATOMIC-ABSORPTION SPECTROMETRY
journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
J. Anal. At. Spectrom.
volume
17
issue
8
pages
897 - 903
Web of Science type
Article
Web of Science id
000177254600023
JCR category
CHEMISTRY, ANALYTICAL
JCR impact factor
4.25 (2002)
JCR rank
4/67 (2002)
JCR quartile
1 (2002)
ISSN
0267-9477
DOI
10.1039/b200749p
language
English
UGent publication?
yes
classification
A1
id
162614
handle
http://hdl.handle.net/1854/LU-162614
date created
2004-01-14 13:39:00
date last changed
2012-11-14 10:54:29
@article{162614,
  abstract     = {In this work, a method has been developed for the fast and reliable determination of silicon in polyamides (two samples with silicon contents of 10 and 50 mug g(-1) were analyzed) by means of solid sampling electrothermal vaporization ICP-MS. For all silicon isotopes, the occurrence of spectral interferences was studied as a function of the vaporization temperature. The benefits of the use of palladium as a chemical modifier were investigated. Finally, a vaporization temperature of 2400 degreesC, monitoring of Si-29(+) and the addition of 1 mug of palladium were found to be the optimum conditions for the determination. The method finally proposed shows very interesting features for this particular element: the ability to use aqueous standard solutions for calibration, a low sample consumption (a few milligrams only), a high sample throughput (20 min analysis time per sample), a low limit of detection (0.3 mug g(-1)) and a reduced risk of analyte losses and, particularly, of contamination. Additionally, the approach also exhibits multi-element capabilities.},
  author       = {Resano Ezcaray, Martin and Verstraete, Marieke and Vanhaecke, Frank and Moens, Luc},
  issn         = {0267-9477},
  journal      = {JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY},
  keyword      = {BIOLOGICAL-MATERIALS,ICP-MS,PROCESS CHEMICALS,BORON-NITRIDE,IMPURITIES,PALLADIUM,ZIRCONIUM,GRAPHITE-FURNACE,EMISSION-SPECTROMETRY,ATOMIC-ABSORPTION SPECTROMETRY},
  language     = {eng},
  number       = {8},
  pages        = {897--903},
  title        = {Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry},
  url          = {http://dx.doi.org/10.1039/b200749p},
  volume       = {17},
  year         = {2002},
}

Chicago
Resano Ezcaray, Martin, Marieke Verstraete, Frank Vanhaecke, and Luc Moens. 2002. “Direct Determination of Trace Amounts of Silicon in Polyamides by Means of Solid Sampling Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry.” Journal of Analytical Atomic Spectrometry 17 (8): 897–903.
APA
Resano Ezcaray, M., Verstraete, M., Vanhaecke, F., & Moens, L. (2002). Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 17(8), 897–903.
Vancouver
1.
Resano Ezcaray M, Verstraete M, Vanhaecke F, Moens L. Direct determination of trace amounts of silicon in polyamides by means of solid sampling electrothermal vaporization inductively coupled plasma mass spectrometry. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 2002;17(8):897–903.
MLA
Resano Ezcaray, Martin, Marieke Verstraete, Frank Vanhaecke, et al. “Direct Determination of Trace Amounts of Silicon in Polyamides by Means of Solid Sampling Electrothermal Vaporization Inductively Coupled Plasma Mass Spectrometry.” JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 17.8 (2002): 897–903. Print.