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Small sample corrections for LTS and MCD.

G PISON, Stefan Van Aelst and G WILLEMS (2002) METRIKA. 55(1-2). p.111-123
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author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
METRIKA
volume
55
issue
1-2
pages
111-123 pages
Web of Science type
Article
Web of Science id
000175702200011
JCR category
STATISTICS & PROBABILITY
JCR impact factor
0.414 (2002)
JCR rank
49/71 (2002)
JCR quartile
3 (2002)
ISSN
0026-1335
language
English
UGent publication?
yes
classification
A1
id
161939
handle
http://hdl.handle.net/1854/LU-161939
date created
2004-01-14 13:39:00
date last changed
2016-12-19 15:38:24
@article{161939,
  author       = {PISON, G and Van Aelst, Stefan and WILLEMS, G},
  issn         = {0026-1335},
  journal      = {METRIKA},
  language     = {eng},
  number       = {1-2},
  pages        = {111--123},
  title        = {Small sample corrections for LTS and MCD.},
  volume       = {55},
  year         = {2002},
}

Chicago
PISON, G, Stefan Van Aelst, and G WILLEMS. 2002. “Small Sample Corrections for LTS and MCD.” Metrika 55 (1-2): 111–123.
APA
PISON, G., Van Aelst, S., & WILLEMS, G. (2002). Small sample corrections for LTS and MCD. METRIKA, 55(1-2), 111–123.
Vancouver
1.
PISON G, Van Aelst S, WILLEMS G. Small sample corrections for LTS and MCD. METRIKA. 2002;55(1-2):111–23.
MLA
PISON, G, Stefan Van Aelst, and G WILLEMS. “Small Sample Corrections for LTS and MCD.” METRIKA 55.1-2 (2002): 111–123. Print.