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Reuse Distance as a Metric for Cache Behavior.

Kristof Beyls and Erik D'Hollander UGent (2001) Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001. p.617-622
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001
pages
617-622 pages
language
English
UGent publication?
yes
classification
C1
id
144051
handle
http://hdl.handle.net/1854/LU-144051
date created
2004-01-14 13:38:00
date last changed
2016-12-19 15:35:24
@inproceedings{144051,
  author       = {Beyls, Kristof and D'Hollander, Erik},
  booktitle    = {Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001},
  language     = {eng},
  pages        = {617--622},
  title        = {Reuse Distance as a Metric for Cache Behavior.},
  year         = {2001},
}

Chicago
Beyls, Kristof, and Erik D’Hollander. 2001. “Reuse Distance as a Metric for Cache Behavior.” In Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001, 617–622.
APA
Beyls, Kristof, & D’Hollander, E. (2001). Reuse Distance as a Metric for Cache Behavior. Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001 (pp. 617–622).
Vancouver
1.
Beyls K, D’Hollander E. Reuse Distance as a Metric for Cache Behavior. Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001. 2001. p. 617–22.
MLA
Beyls, Kristof, and Erik D’Hollander. “Reuse Distance as a Metric for Cache Behavior.” Proceedings of the IASTED International Conference on Parallel and Distributed Computing and Systems, IASTED, Anaheim, California, USA, 2001. 2001. 617–622. Print.