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Modeling the shielding effectiveness and resonances of metallic shielding enclosures loaded with PCB's.

Ward Wallyn and Daniël De Zutter UGent (2001) Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada. p.691-696
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada
pages
691-696 pages
language
English
UGent publication?
yes
classification
C1
id
144013
handle
http://hdl.handle.net/1854/LU-144013
date created
2004-01-14 13:38:00
date last changed
2016-12-19 15:35:24
@inproceedings{144013,
  author       = {Wallyn, Ward and De Zutter, Dani{\"e}l},
  booktitle    = {Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montr{\'e}al, Canada},
  language     = {eng},
  pages        = {691--696},
  title        = {Modeling the shielding effectiveness and resonances of metallic shielding enclosures loaded with PCB's.},
  year         = {2001},
}

Chicago
Wallyn, Ward, and Daniël De Zutter. 2001. “Modeling the Shielding Effectiveness and Resonances of Metallic Shielding Enclosures Loaded with PCB’s.” In Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada, 691–696.
APA
Wallyn, W., & De Zutter, D. (2001). Modeling the shielding effectiveness and resonances of metallic shielding enclosures loaded with PCB’s. Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada (pp. 691–696).
Vancouver
1.
Wallyn W, De Zutter D. Modeling the shielding effectiveness and resonances of metallic shielding enclosures loaded with PCB’s. Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada. 2001. p. 691–6.
MLA
Wallyn, Ward, and Daniël De Zutter. “Modeling the Shielding Effectiveness and Resonances of Metallic Shielding Enclosures Loaded with PCB’s.” Proceedings of the 2001 IEEE EMC International Symposium, Vol. 2, August 13-17, 2001, Montréal, Canada. 2001. 691–696. Print.