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Dimensioning of open-ended coaxial probes for the dielectric characterization of thinlayered materials

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Chicago
Stevens, Nobby, and Luc Martens. 2001. “Dimensioning of Open-ended Coaxial Probes for the Dielectric Characterization of Thinlayered Materials.” In Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001), Vol. 2, 21-23 May 2001, Bundapest, Hungary, P. 1288- 1290.
APA
Stevens, N., & Martens, L. (2001). Dimensioning of open-ended coaxial probes for the dielectric characterization of thinlayered materials. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001), Vol. 2, 21-23 May 2001, Bundapest, Hungary, p. 1288- 1290.
Vancouver
1.
Stevens N, Martens L. Dimensioning of open-ended coaxial probes for the dielectric characterization of thinlayered materials. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001), Vol. 2, 21-23 May 2001, Bundapest, Hungary, p. 1288- 1290. 2001.
MLA
Stevens, Nobby, and Luc Martens. “Dimensioning of Open-ended Coaxial Probes for the Dielectric Characterization of Thinlayered Materials.” Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001), Vol. 2, 21-23 May 2001, Bundapest, Hungary, P. 1288- 1290. 2001. Print.
@inproceedings{143932,
  author       = {Stevens, Nobby and Martens, Luc},
  booktitle    = {Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference (IMTC/2001), Vol. 2, 21-23 May 2001, Bundapest, Hungary, p. 1288- 1290},
  language     = {eng},
  title        = {Dimensioning of open-ended coaxial probes for the dielectric characterization of thinlayered materials},
  year         = {2001},
}