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White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN.

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Chicago
Chen, Wei, PJ MCNALLY, Koen Jacobs, T TUOMI, AN DANILEWSKY, D LOWNEY, and J KANATHARANA. 2001. “White Beam Synchroton X-ray Topography and X-ray Diffraction Measurements of Epitaxial Lateral Overgrowth of GaN.” In MRS Fall Meeting 2001, Symposium I : GaN and Related Alloys, November 26-30, 2001, Boston, Massachusetts, USA, 176–177.
APA
Chen, W., MCNALLY, P., Jacobs, K., TUOMI, T., DANILEWSKY, A., LOWNEY, D., & KANATHARANA, J. (2001). White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN. MRS Fall Meeting 2001, Symposium I : GaN and related alloys, November 26-30, 2001, Boston, Massachusetts, USA (pp. 176–177).
Vancouver
1.
Chen W, MCNALLY P, Jacobs K, TUOMI T, DANILEWSKY A, LOWNEY D, et al. White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN. MRS Fall Meeting 2001, Symposium I : GaN and related alloys, November 26-30, 2001, Boston, Massachusetts, USA. 2001. p. 176–7.
MLA
Chen, Wei, PJ MCNALLY, Koen Jacobs, et al. “White Beam Synchroton X-ray Topography and X-ray Diffraction Measurements of Epitaxial Lateral Overgrowth of GaN.” MRS Fall Meeting 2001, Symposium I : GaN and Related Alloys, November 26-30, 2001, Boston, Massachusetts, USA. 2001. 176–177. Print.
@inproceedings{143588,
  author       = {Chen, Wei and MCNALLY, PJ and Jacobs, Koen and TUOMI, T and DANILEWSKY, AN and LOWNEY, D and KANATHARANA, J},
  booktitle    = {MRS Fall Meeting 2001, Symposium I : GaN and related alloys, November 26-30, 2001, Boston, Massachusetts, USA},
  language     = {eng},
  pages        = {176--177},
  title        = {White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN.},
  year         = {2001},
}