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Direct determination of sulfur in Bisphenol A at ultratrace levels by means of solid sampling-electrothermal vaporization-ICP-MS

Martin Resano Ezcaray, Marieke Verstraete, Frank Vanhaecke UGent, Luc Moens UGent and J Claessens (2001) JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 16(8). p.793-800
abstract
It is known that the accurate determination of ppm levels of sulfur in solid samples is very complicated. One of the approaches that have been evaluated in order to improve the detection limits for this element is the use of electrothermal vaporization (ETV) as an alternative means of sample introduction in ICP mass spectrometry. In this way, it is possible to achieve a significant decrease of the oxygen-based interferences. In this work, the possibilities of electrothermal vaporization ICP-MS for sulfur determination are extended one step further, as the direct determination of the analyte in two Bisphenol samples (about 0.3 and 2 mug g(-1)) is carried out. Bisphenol A is a precursor in the production of polycarbonate and epoxy resins, in which sulfur is present as an impurity. S-34 was the isotope selected for the determination. Palladium (0.5 mug) was found to be the best chemical modifier and is capable of both preventing analyte losses (up to a pyrolysis temperature of 400 degreesC) and improving the sensitivity. Some evidence as to the way in which it may act is also presented. Nitric acid was added as well in order to favour an efficient matrix removal prior to the release of the analyte. The resulting solid sampling-electrothermal vaporization-ICP-MS method combines very interesting features for this particular element: a high sample throughput (20-25 min per sample), a low limit of detection (4 mug g(-1)) and a reduced risk of analyte losses and/or contamination. Moreover, it presents some advantages over the dedicated sulfur analyzers that are very popular in the industry: low sample consumption (a few milligrams), multielement possibilities and the ability to use aqueous standard solutions for calibration. On the other hand, the overall method cannot be considered as very economic, but, for many laboratories that already own an ICP-MS instrument, the acquisition of an ETV device would be relatively inexpensive.
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
keyword
ATOMIC-ABSORPTION SPECTROMETRY, PLASMA-MASS-SPECTROMETRY, CHEMICAL MODIFIERS, ANALYTE TRANSPORT, PLATINUM, ELEMENTS, TRACE, PALLADIUM, CADMIUM, SIGNAL
journal title
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
J. Anal. At. Spectrom.
volume
16
issue
8
pages
793 - 800
Web of Science type
Article
Web of Science id
000170559600002
JCR category
CHEMISTRY, ANALYTICAL
JCR impact factor
3.305 (2001)
JCR rank
5/67 (2001)
JCR quartile
1 (2001)
ISSN
0267-9477
DOI
10.1039/b103857p
language
English
UGent publication?
yes
classification
A1
id
138512
handle
http://hdl.handle.net/1854/LU-138512
date created
2004-01-14 13:37:00
date last changed
2012-11-14 13:36:30
@article{138512,
  abstract     = {It is known that the accurate determination of ppm levels of sulfur in solid samples is very complicated. One of the approaches that have been evaluated in order to improve the detection limits for this element is the use of electrothermal vaporization (ETV) as an alternative means of sample introduction in ICP mass spectrometry. In this way, it is possible to achieve a significant decrease of the oxygen-based interferences. In this work, the possibilities of electrothermal vaporization ICP-MS for sulfur determination are extended one step further, as the direct determination of the analyte in two Bisphenol samples (about 0.3 and 2 mug g(-1)) is carried out. Bisphenol A is a precursor in the production of polycarbonate and epoxy resins, in which sulfur is present as an impurity. S-34 was the isotope selected for the determination. Palladium (0.5 mug) was found to be the best chemical modifier and is capable of both preventing analyte losses (up to a pyrolysis temperature of 400 degreesC) and improving the sensitivity. Some evidence as to the way in which it may act is also presented. Nitric acid was added as well in order to favour an efficient matrix removal prior to the release of the analyte. The resulting solid sampling-electrothermal vaporization-ICP-MS method combines very interesting features for this particular element: a high sample throughput (20-25 min per sample), a low limit of detection (4 mug g(-1)) and a reduced risk of analyte losses and/or contamination. Moreover, it presents some advantages over the dedicated sulfur analyzers that are very popular in the industry: low sample consumption (a few milligrams), multielement possibilities and the ability to use aqueous standard solutions for calibration. On the other hand, the overall method cannot be considered as very economic, but, for many laboratories that already own an ICP-MS instrument, the acquisition of an ETV device would be relatively inexpensive.},
  author       = {Resano Ezcaray, Martin and Verstraete, Marieke and Vanhaecke, Frank and Moens, Luc and Claessens, J},
  issn         = {0267-9477},
  journal      = {JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY},
  keyword      = {ATOMIC-ABSORPTION SPECTROMETRY,PLASMA-MASS-SPECTROMETRY,CHEMICAL MODIFIERS,ANALYTE TRANSPORT,PLATINUM,ELEMENTS,TRACE,PALLADIUM,CADMIUM,SIGNAL},
  language     = {eng},
  number       = {8},
  pages        = {793--800},
  title        = {Direct determination of sulfur in Bisphenol A at ultratrace levels by means of solid sampling-electrothermal vaporization-ICP-MS},
  url          = {http://dx.doi.org/10.1039/b103857p},
  volume       = {16},
  year         = {2001},
}

Chicago
Resano Ezcaray, Martin, Marieke Verstraete, Frank Vanhaecke, Luc Moens, and J Claessens. 2001. “Direct Determination of Sulfur in Bisphenol A at Ultratrace Levels by Means of Solid Sampling-electrothermal vaporization-ICP-MS.” Journal of Analytical Atomic Spectrometry 16 (8): 793–800.
APA
Resano Ezcaray, M., Verstraete, M., Vanhaecke, F., Moens, L., & Claessens, J. (2001). Direct determination of sulfur in Bisphenol A at ultratrace levels by means of solid sampling-electrothermal vaporization-ICP-MS. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 16(8), 793–800.
Vancouver
1.
Resano Ezcaray M, Verstraete M, Vanhaecke F, Moens L, Claessens J. Direct determination of sulfur in Bisphenol A at ultratrace levels by means of solid sampling-electrothermal vaporization-ICP-MS. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY. 2001;16(8):793–800.
MLA
Resano Ezcaray, Martin, Marieke Verstraete, Frank Vanhaecke, et al. “Direct Determination of Sulfur in Bisphenol A at Ultratrace Levels by Means of Solid Sampling-electrothermal vaporization-ICP-MS.” JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY 16.8 (2001): 793–800. Print.