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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM.

(2001) PHYSICA B-CONDENSED MATTER. 308. p.294-297
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Chicago
De Gryse, Olivier, Paul Clauws, O LEBEDEV, J VAN LANDUYT, J VANHELLEMONT, C CLAEYS, and E SIMOEN. 2001. “Chemical and Structural Characterization of Oxygen Precipitates in Silicon by Infrared Spectroscopy and TEM.” Physica B-condensed Matter 308: 294–297.
APA
De Gryse, Olivier, Clauws, P., LEBEDEV, O., VAN LANDUYT, J., VANHELLEMONT, J., CLAEYS, C., & SIMOEN, E. (2001). Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM. PHYSICA B-CONDENSED MATTER, 308, 294–297.
Vancouver
1.
De Gryse O, Clauws P, LEBEDEV O, VAN LANDUYT J, VANHELLEMONT J, CLAEYS C, et al. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM. PHYSICA B-CONDENSED MATTER. 2001;308:294–7.
MLA
De Gryse, Olivier, Paul Clauws, O LEBEDEV, et al. “Chemical and Structural Characterization of Oxygen Precipitates in Silicon by Infrared Spectroscopy and TEM.” PHYSICA B-CONDENSED MATTER 308 (2001): 294–297. Print.
@article{137562,
  author       = {De Gryse, Olivier and Clauws, Paul and LEBEDEV, O and VAN LANDUYT, J and VANHELLEMONT, J and CLAEYS, C and SIMOEN, E},
  issn         = {0921-4526},
  journal      = {PHYSICA B-CONDENSED MATTER},
  language     = {eng},
  pages        = {294--297},
  title        = {Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM.},
  volume       = {308},
  year         = {2001},
}

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