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Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM.

Olivier De Gryse, Paul Clauws, O LEBEDEV, J VAN LANDUYT, J VANHELLEMONT, C CLAEYS and E SIMOEN (2001) PHYSICA B-CONDENSED MATTER. 308. p.294-297
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author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
PHYSICA B-CONDENSED MATTER
Physica B
volume
308
pages
294-297 pages
Web of Science type
Article
Web of Science id
000173660100073
JCR category
PHYSICS, CONDENSED MATTER
JCR impact factor
0.663 (2001)
JCR rank
37/54 (2001)
JCR quartile
3 (2001)
ISSN
0921-4526
language
English
UGent publication?
yes
classification
A1
id
137562
handle
http://hdl.handle.net/1854/LU-137562
date created
2004-01-14 13:37:00
date last changed
2016-12-19 15:38:30
@article{137562,
  author       = {De Gryse, Olivier and Clauws, Paul and LEBEDEV, O and VAN LANDUYT, J and VANHELLEMONT, J and CLAEYS, C and SIMOEN, E},
  issn         = {0921-4526},
  journal      = {PHYSICA B-CONDENSED MATTER},
  language     = {eng},
  pages        = {294--297},
  title        = {Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM.},
  volume       = {308},
  year         = {2001},
}

Chicago
De Gryse, Olivier, Paul Clauws, O LEBEDEV, J VAN LANDUYT, J VANHELLEMONT, C CLAEYS, and E SIMOEN. 2001. “Chemical and Structural Characterization of Oxygen Precipitates in Silicon by Infrared Spectroscopy and TEM.” Physica B-condensed Matter 308: 294–297.
APA
De Gryse, Olivier, Clauws, P., LEBEDEV, O., VAN LANDUYT, J., VANHELLEMONT, J., CLAEYS, C., & SIMOEN, E. (2001). Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM. PHYSICA B-CONDENSED MATTER, 308, 294–297.
Vancouver
1.
De Gryse O, Clauws P, LEBEDEV O, VAN LANDUYT J, VANHELLEMONT J, CLAEYS C, et al. Chemical and structural characterization of oxygen precipitates in silicon by infrared spectroscopy and TEM. PHYSICA B-CONDENSED MATTER. 2001;308:294–7.
MLA
De Gryse, Olivier, Paul Clauws, O LEBEDEV, et al. “Chemical and Structural Characterization of Oxygen Precipitates in Silicon by Infrared Spectroscopy and TEM.” PHYSICA B-CONDENSED MATTER 308 (2001): 294–297. Print.