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A quality measure for halftones obtained by linear and nonlinear resampling.

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Chicago
Van De Ville, Dimitri, Koen Denecker, Wilfried Philips, and Ignace Lemahieu. 2000. “A Quality Measure for Halftones Obtained by Linear and Nonlinear Resampling.” In Proceedings of the Workshop on Circuits, Systems and Signal Processing, Veldhoven, 2000, 549–556.
APA
Van De Ville, Dimitri, Denecker, K., Philips, W., & Lemahieu, I. (2000). A quality measure for halftones obtained by linear and nonlinear resampling. Proceedings of the workshop on circuits, systems and signal processing, Veldhoven, 2000 (pp. 549–556).
Vancouver
1.
Van De Ville D, Denecker K, Philips W, Lemahieu I. A quality measure for halftones obtained by linear and nonlinear resampling. Proceedings of the workshop on circuits, systems and signal processing, Veldhoven, 2000. 2000. p. 549–56.
MLA
Van De Ville, Dimitri, Koen Denecker, Wilfried Philips, et al. “A Quality Measure for Halftones Obtained by Linear and Nonlinear Resampling.” Proceedings of the Workshop on Circuits, Systems and Signal Processing, Veldhoven, 2000. 2000. 549–556. Print.
@inproceedings{129856,
  author       = {Van De Ville, Dimitri and Denecker, Koen and Philips, Wilfried and Lemahieu, Ignace},
  booktitle    = {Proceedings of the workshop on circuits, systems and signal processing, Veldhoven, 2000},
  language     = {eng},
  pages        = {549--556},
  title        = {A quality measure for halftones obtained by linear and nonlinear resampling.},
  year         = {2000},
}