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Electrical modeling of interface roughness in thin film electroluminescent devices.

Kristiaan Neyts UGent, Patrick De Visschere UGent, Bart Soenen and Gert Stuyven (2000) IEEE TRANSACTIONS ON ELECTRON DEVICES. 47(2). p.318-325
Please use this url to cite or link to this publication:
author
organization
year
type
journalArticle (original)
publication status
published
subject
journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
IEEE Trans. Electron Devices
volume
47
issue
2
pages
318-325 pages
Web of Science type
Article
Web of Science id
000085344800011
ISSN
0018-9383
language
English
UGent publication?
yes
classification
A1
id
129761
handle
http://hdl.handle.net/1854/LU-129761
date created
2004-01-14 13:36:00
date last changed
2016-12-19 15:37:49
@article{129761,
  author       = {Neyts, Kristiaan and De Visschere, Patrick and Soenen, Bart and Stuyven, Gert},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {2},
  pages        = {318--325},
  title        = {Electrical modeling of interface roughness in thin film electroluminescent devices.},
  volume       = {47},
  year         = {2000},
}

Chicago
Neyts, Kristiaan, Patrick De Visschere, Bart Soenen, and Gert Stuyven. 2000. “Electrical Modeling of Interface Roughness in Thin Film Electroluminescent Devices.” Ieee Transactions on Electron Devices 47 (2): 318–325.
APA
Neyts, Kristiaan, De Visschere, P., Soenen, B., & Stuyven, G. (2000). Electrical modeling of interface roughness in thin film electroluminescent devices. IEEE TRANSACTIONS ON ELECTRON DEVICES, 47(2), 318–325.
Vancouver
1.
Neyts K, De Visschere P, Soenen B, Stuyven G. Electrical modeling of interface roughness in thin film electroluminescent devices. IEEE TRANSACTIONS ON ELECTRON DEVICES. 2000;47(2):318–25.
MLA
Neyts, Kristiaan, Patrick De Visschere, Bart Soenen, et al. “Electrical Modeling of Interface Roughness in Thin Film Electroluminescent Devices.” IEEE TRANSACTIONS ON ELECTRON DEVICES 47.2 (2000): 318–325. Print.