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Electrical modeling of interface roughness in thin film electroluminescent devices.

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Chicago
Neyts, Kristiaan, Patrick De Visschere, Bart Soenen, and Gert Stuyven. 2000. “Electrical Modeling of Interface Roughness in Thin Film Electroluminescent Devices.” Ieee Transactions on Electron Devices 47 (2): 318–325.
APA
Neyts, Kristiaan, De Visschere, P., Soenen, B., & Stuyven, G. (2000). Electrical modeling of interface roughness in thin film electroluminescent devices. IEEE TRANSACTIONS ON ELECTRON DEVICES, 47(2), 318–325.
Vancouver
1.
Neyts K, De Visschere P, Soenen B, Stuyven G. Electrical modeling of interface roughness in thin film electroluminescent devices. IEEE TRANSACTIONS ON ELECTRON DEVICES. 2000;47(2):318–25.
MLA
Neyts, Kristiaan, Patrick De Visschere, Bart Soenen, et al. “Electrical Modeling of Interface Roughness in Thin Film Electroluminescent Devices.” IEEE TRANSACTIONS ON ELECTRON DEVICES 47.2 (2000): 318–325. Print.
@article{129761,
  author       = {Neyts, Kristiaan and De Visschere, Patrick and Soenen, Bart and Stuyven, Gert},
  issn         = {0018-9383},
  journal      = {IEEE TRANSACTIONS ON ELECTRON DEVICES},
  language     = {eng},
  number       = {2},
  pages        = {318--325},
  title        = {Electrical modeling of interface roughness in thin film electroluminescent devices.},
  volume       = {47},
  year         = {2000},
}

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