Ghent University Academic Bibliography

Advanced

Effect of seedlayers on magnetic properties and micro-structure in CoCrTa/Cr thin films.

Huizhong Jia, Joeri Veldeman and Marc Burgelman (2000) Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000. p.348-351
Please use this url to cite or link to this publication:
author
organization
year
type
conference
publication status
published
subject
in
Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000
pages
348-351 pages
language
English
UGent publication?
yes
classification
C1
id
129717
handle
http://hdl.handle.net/1854/LU-129717
date created
2004-01-14 13:36:00
date last changed
2016-12-19 15:35:47
@inproceedings{129717,
  author       = {Jia, Huizhong and Veldeman, Joeri and Burgelman, Marc},
  booktitle    = {Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000},
  language     = {eng},
  pages        = {348--351},
  title        = {Effect of seedlayers on magnetic properties and micro-structure in CoCrTa/Cr thin films.},
  year         = {2000},
}

Chicago
Jia, Huizhong, Joeri Veldeman, and Marc Burgelman. 2000. “Effect of Seedlayers on Magnetic Properties and Micro-structure in CoCrTa/Cr Thin Films.” In Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000, 348–351.
APA
Jia, H., Veldeman, J., & Burgelman, M. (2000). Effect of seedlayers on magnetic properties and micro-structure in CoCrTa/Cr thin films. Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000 (pp. 348–351).
Vancouver
1.
Jia H, Veldeman J, Burgelman M. Effect of seedlayers on magnetic properties and micro-structure in CoCrTa/Cr thin films. Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000. 2000. p. 348–51.
MLA
Jia, Huizhong, Joeri Veldeman, and Marc Burgelman. “Effect of Seedlayers on Magnetic Properties and Micro-structure in CoCrTa/Cr Thin Films.” Fourth International Conference on Thin Film Physics and Applications, 4086, SPIE, Shangai, China, 2000. 2000. 348–351. Print.