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Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration.

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MLA
GILLON, R, Wim Van De Sype, D VANHOENACKER, et al. “Comparing High-frequency De-embedding Strategies: Immittance Correction and In-situ Calibration.” Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA. 2000. 241–245. Print.
APA
GILLON, R., Van De Sype, W., VANHOENACKER, D., & Martens, L. (2000). Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration. Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA (pp. 241–245).
Chicago author-date
GILLON, R, Wim Van De Sype, D VANHOENACKER, and Luc Martens. 2000. “Comparing High-frequency De-embedding Strategies: Immittance Correction and In-situ Calibration.” In Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA, 241–245.
Chicago author-date (all authors)
GILLON, R, Wim Van De Sype, D VANHOENACKER, and Luc Martens. 2000. “Comparing High-frequency De-embedding Strategies: Immittance Correction and In-situ Calibration.” In Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA, 241–245.
Vancouver
1.
GILLON R, Van De Sype W, VANHOENACKER D, Martens L. Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration. Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA. 2000. p. 241–5.
IEEE
[1]
R. GILLON, W. Van De Sype, D. VANHOENACKER, and L. Martens, “Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration.,” in Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA, 2000, pp. 241–245.
@inproceedings{129319,
  author       = {{GILLON, R and Van De Sype, Wim and VANHOENACKER, D and Martens, Luc}},
  booktitle    = {{Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA}},
  language     = {{eng}},
  pages        = {{241--245}},
  title        = {{Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration.}},
  year         = {{2000}},
}